A Gamma process-based degradation testing of silicone encapsulant used in LED packaging

Silicone encapsulant is widely used in light-emitting diode (LED) packaging because it offers high light transmittance, high refractive index, high thermal stability, and long lifetimes. However, it is extremely sensitive to moisture when the LED operates under high temperature and high humidity. In...

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Main Authors: Jiajie Fan, Ye Chen, Zhou Jing, Mesfin Seid Ibrahim, Miao Cai
Format: Article
Language:English
Published: Elsevier 2021-04-01
Series:Polymer Testing
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S0142941821000404
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author Jiajie Fan
Ye Chen
Zhou Jing
Mesfin Seid Ibrahim
Miao Cai
author_facet Jiajie Fan
Ye Chen
Zhou Jing
Mesfin Seid Ibrahim
Miao Cai
author_sort Jiajie Fan
collection DOAJ
description Silicone encapsulant is widely used in light-emitting diode (LED) packaging because it offers high light transmittance, high refractive index, high thermal stability, and long lifetimes. However, it is extremely sensitive to moisture when the LED operates under high temperature and high humidity. In this study, constant moisture stress-accelerated degradation tests (CSADT) are designed with three different thermal stresses on silicone encapsulant, and its real lumen decay and color shift lifetimes are predicted by integrating the accelerated lifetime model with the Gamma process model considering the random effects of the degradation data. The results show that: (1) the lumen decay path after natural logarithmic transformation as well as the color shift degradation path can be well fitted with the linear model. In addition, the degradation rate is related to the thermal stress under the same humidity stress condition; (2) the Gamma process model has a high prediction accuracy when the lumen decay lifetime is used for estimation. On the contrary, the least squares regression (LSR) model has shown superior prediction accuracy versus the Gamma process model when color shift degradation data are used.
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spelling doaj.art-c9e936cba5b540f6a67865ea9dc10c162022-12-21T23:41:33ZengElsevierPolymer Testing0142-94182021-04-0196107090A Gamma process-based degradation testing of silicone encapsulant used in LED packagingJiajie Fan0Ye Chen1Zhou Jing2Mesfin Seid Ibrahim3Miao Cai4Institute of Future Lighting, Academy for Engineering & Technology, Fudan University, Shanghai, 200433, China; College of Mechanical and Electrical Engineering, Hohai University, Changzhou, 213022, China; Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, 213161, China; Corresponding author. Institute of Future Lighting, Academy for Engineering & Technology, Fudan University, Shanghai, 200433, China.College of Mechanical and Electrical Engineering, Hohai University, Changzhou, 213022, China; Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, 213161, ChinaCollege of Mechanical and Electrical Engineering, Hohai University, Changzhou, 213022, ChinaDepartment of Industrial and System Engineering, The Hong Kong Polytechnic University, Hung Hom, Hong KongSchool of Mechanism and Electrical Engineering, Guilin University of Electronic Technology, Guilin, 541004, ChinaSilicone encapsulant is widely used in light-emitting diode (LED) packaging because it offers high light transmittance, high refractive index, high thermal stability, and long lifetimes. However, it is extremely sensitive to moisture when the LED operates under high temperature and high humidity. In this study, constant moisture stress-accelerated degradation tests (CSADT) are designed with three different thermal stresses on silicone encapsulant, and its real lumen decay and color shift lifetimes are predicted by integrating the accelerated lifetime model with the Gamma process model considering the random effects of the degradation data. The results show that: (1) the lumen decay path after natural logarithmic transformation as well as the color shift degradation path can be well fitted with the linear model. In addition, the degradation rate is related to the thermal stress under the same humidity stress condition; (2) the Gamma process model has a high prediction accuracy when the lumen decay lifetime is used for estimation. On the contrary, the least squares regression (LSR) model has shown superior prediction accuracy versus the Gamma process model when color shift degradation data are used.http://www.sciencedirect.com/science/article/pii/S0142941821000404LED packagingSilicone encapsulantLumen decayColor shiftGamma process
spellingShingle Jiajie Fan
Ye Chen
Zhou Jing
Mesfin Seid Ibrahim
Miao Cai
A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
Polymer Testing
LED packaging
Silicone encapsulant
Lumen decay
Color shift
Gamma process
title A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
title_full A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
title_fullStr A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
title_full_unstemmed A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
title_short A Gamma process-based degradation testing of silicone encapsulant used in LED packaging
title_sort gamma process based degradation testing of silicone encapsulant used in led packaging
topic LED packaging
Silicone encapsulant
Lumen decay
Color shift
Gamma process
url http://www.sciencedirect.com/science/article/pii/S0142941821000404
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