On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories

The revolution in the field of information processing systems has created a huge demand for reliable and enhanced data storage capabilities. This demand is being met by advances in channel coding algorithms along with upward scaling of the capacities of hardware devices. NAND Flash memory is a type...

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Main Authors: G. Achala, U. Shripathi Acharya, Pathipati Srihari
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10179920/
_version_ 1797772616214249472
author G. Achala
U. Shripathi Acharya
Pathipati Srihari
author_facet G. Achala
U. Shripathi Acharya
Pathipati Srihari
author_sort G. Achala
collection DOAJ
description The revolution in the field of information processing systems has created a huge demand for reliable and enhanced data storage capabilities. This demand is being met by advances in channel coding algorithms along with upward scaling of the capacities of hardware devices. NAND Flash memory is a type of non-volatile memory. Scaling of the size of flash memories from Single Level Cell (SLC) devices to Multilevel cell (MLC) devices has increased the storage capacity. However, these multi-bit per cell architectures are characterized by significantly higher Raw Bit Error Rate (RBER) values when compared with SLC architectures. The requirement of low Undetected Bit Error Rate (UBER) values has motivated us to synthesize powerful channel codes for enhancing the integrity of information Storage in multi-level NAND Flash Memory devices. This paper describes the synthesis of novel Subfield Subcodes of Reed Solomon Codes (SSRS) and Reed-Solomon (RS) codes which are matched to multi-bit per cell architectures. UBER values have been calculated for each of the synthesized codes described in this paper. This allows the determination of the performance and the improvement in data storage integrity brought by using these codes. We have shown that the synthesized SSRS and RS codes can provide very low UBER even when the corresponding RBER values are appreciable. As RS codes permit the detection and correction of a greater number of errors for a given code length, their performance is superior to that of SSRS codes. This improved performance is obtained at the cost of greater complexity of encoding and decoding processes.
first_indexed 2024-03-12T21:54:30Z
format Article
id doaj.art-ca015754008b450aa23aaa748b6d1bc4
institution Directory Open Access Journal
issn 2169-3536
language English
last_indexed 2024-03-12T21:54:30Z
publishDate 2023-01-01
publisher IEEE
record_format Article
series IEEE Access
spelling doaj.art-ca015754008b450aa23aaa748b6d1bc42023-07-25T23:00:27ZengIEEEIEEE Access2169-35362023-01-0111731987321710.1109/ACCESS.2023.329454410179920On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash MemoriesG. Achala0https://orcid.org/0009-0001-4613-1773U. Shripathi Acharya1Pathipati Srihari2https://orcid.org/0000-0001-9168-2753National Institute of Technology, Karnataka (NIT-K), Surathkal, IndiaNational Institute of Technology, Karnataka (NIT-K), Surathkal, IndiaNational Institute of Technology, Karnataka (NIT-K), Surathkal, IndiaThe revolution in the field of information processing systems has created a huge demand for reliable and enhanced data storage capabilities. This demand is being met by advances in channel coding algorithms along with upward scaling of the capacities of hardware devices. NAND Flash memory is a type of non-volatile memory. Scaling of the size of flash memories from Single Level Cell (SLC) devices to Multilevel cell (MLC) devices has increased the storage capacity. However, these multi-bit per cell architectures are characterized by significantly higher Raw Bit Error Rate (RBER) values when compared with SLC architectures. The requirement of low Undetected Bit Error Rate (UBER) values has motivated us to synthesize powerful channel codes for enhancing the integrity of information Storage in multi-level NAND Flash Memory devices. This paper describes the synthesis of novel Subfield Subcodes of Reed Solomon Codes (SSRS) and Reed-Solomon (RS) codes which are matched to multi-bit per cell architectures. UBER values have been calculated for each of the synthesized codes described in this paper. This allows the determination of the performance and the improvement in data storage integrity brought by using these codes. We have shown that the synthesized SSRS and RS codes can provide very low UBER even when the corresponding RBER values are appreciable. As RS codes permit the detection and correction of a greater number of errors for a given code length, their performance is superior to that of SSRS codes. This improved performance is obtained at the cost of greater complexity of encoding and decoding processes.https://ieeexplore.ieee.org/document/10179920/Bit error ratechannel codingerror correction codeflash memoryNAND flashReed-Solomon codes
spellingShingle G. Achala
U. Shripathi Acharya
Pathipati Srihari
On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories
IEEE Access
Bit error rate
channel coding
error correction code
flash memory
NAND flash
Reed-Solomon codes
title On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories
title_full On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories
title_fullStr On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories
title_full_unstemmed On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories
title_short On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories
title_sort on the design of ssrs and rs codes for enhancing the integrity of information storage in nand flash memories
topic Bit error rate
channel coding
error correction code
flash memory
NAND flash
Reed-Solomon codes
url https://ieeexplore.ieee.org/document/10179920/
work_keys_str_mv AT gachala onthedesignofssrsandrscodesforenhancingtheintegrityofinformationstorageinnandflashmemories
AT ushripathiacharya onthedesignofssrsandrscodesforenhancingtheintegrityofinformationstorageinnandflashmemories
AT pathipatisrihari onthedesignofssrsandrscodesforenhancingtheintegrityofinformationstorageinnandflashmemories