An Improved Hidden Markov Model for Monitoring the Process with Autocorrelated Observations

An Improved Hidden Markov Model for Monitoring the Process with Autocorrelated Observations

With the development of intelligent manufacturing, automated data acquisition techniques are widely used. The autocorrelations between data that are collected from production processes have become more common. Residual charts are a good approach to monitoring the process with data autocorrelation. A...

Full description

Bibliographic Details
Main Authors: Yaping Li, Haiyan Li, Zhen Chen, Ying Zhu
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Energies
Subjects:
hidden Markov model (HMM)
autocorrelation
residual chart
Online Access:https://www.mdpi.com/1996-1073/15/5/1685

Similar Items

Similar Items