Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-in Thermography and Localized Segmentation

Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-in Thermography and Localized Segmentation

The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significa...

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Bibliographic Details
Main Authors: Haitao Zheng, Linghao Zhou, Ryan Marks, Tuomas Happonen, Thomas M. Kraft
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Applied Sciences
Subjects:
automated defect recognition
roll-to-roll
printing
organic photovoltaic
thin film
non-destructive testing
Online Access:https://www.mdpi.com/2076-3417/12/4/2005

Internet

https://www.mdpi.com/2076-3417/12/4/2005

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