Deep learning enables structured illumination microscopy with low light levels and enhanced speed
Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light condi...
Main Authors: | , , , , , , , , |
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Format: | Article |
Language: | English |
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Nature Portfolio
2020-04-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-020-15784-x |
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author | Luhong Jin Bei Liu Fenqiang Zhao Stephen Hahn Bowei Dong Ruiyan Song Timothy C. Elston Yingke Xu Klaus M. Hahn |
author_facet | Luhong Jin Bei Liu Fenqiang Zhao Stephen Hahn Bowei Dong Ruiyan Song Timothy C. Elston Yingke Xu Klaus M. Hahn |
author_sort | Luhong Jin |
collection | DOAJ |
description | Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light conditions. |
first_indexed | 2024-12-17T19:30:45Z |
format | Article |
id | doaj.art-cb59b1d9328d413d81e5520a618431fc |
institution | Directory Open Access Journal |
issn | 2041-1723 |
language | English |
last_indexed | 2024-12-17T19:30:45Z |
publishDate | 2020-04-01 |
publisher | Nature Portfolio |
record_format | Article |
series | Nature Communications |
spelling | doaj.art-cb59b1d9328d413d81e5520a618431fc2022-12-21T21:35:16ZengNature PortfolioNature Communications2041-17232020-04-011111710.1038/s41467-020-15784-xDeep learning enables structured illumination microscopy with low light levels and enhanced speedLuhong Jin0Bei Liu1Fenqiang Zhao2Stephen Hahn3Bowei Dong4Ruiyan Song5Timothy C. Elston6Yingke Xu7Klaus M. Hahn8Department of Pharmacology, University of North Carolina at Chapel HillDepartment of Pharmacology, University of North Carolina at Chapel HillDepartment of Pharmacology, University of North Carolina at Chapel HillDepartment of Pharmacology, University of North Carolina at Chapel HillDepartment of Pharmacology, University of North Carolina at Chapel HillDepartment of Pharmacology, University of North Carolina at Chapel HillDepartment of Pharmacology, University of North Carolina at Chapel HillDepartment of Biomedical Engineering, MOE Key Laboratory of Biomedical Engineering, Zhejiang Provincial Key Laboratory of Cardio-Cerebral Vascular Detection Technology and Medicinal Effectiveness Appraisal, Zhejiang UniversityDepartment of Pharmacology, University of North Carolina at Chapel HillSuper-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light conditions.https://doi.org/10.1038/s41467-020-15784-x |
spellingShingle | Luhong Jin Bei Liu Fenqiang Zhao Stephen Hahn Bowei Dong Ruiyan Song Timothy C. Elston Yingke Xu Klaus M. Hahn Deep learning enables structured illumination microscopy with low light levels and enhanced speed Nature Communications |
title | Deep learning enables structured illumination microscopy with low light levels and enhanced speed |
title_full | Deep learning enables structured illumination microscopy with low light levels and enhanced speed |
title_fullStr | Deep learning enables structured illumination microscopy with low light levels and enhanced speed |
title_full_unstemmed | Deep learning enables structured illumination microscopy with low light levels and enhanced speed |
title_short | Deep learning enables structured illumination microscopy with low light levels and enhanced speed |
title_sort | deep learning enables structured illumination microscopy with low light levels and enhanced speed |
url | https://doi.org/10.1038/s41467-020-15784-x |
work_keys_str_mv | AT luhongjin deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT beiliu deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT fenqiangzhao deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT stephenhahn deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT boweidong deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT ruiyansong deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT timothycelston deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT yingkexu deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed AT klausmhahn deeplearningenablesstructuredilluminationmicroscopywithlowlightlevelsandenhancedspeed |