Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis
A novel light-sheet microscopy (LSM) system that uses the laser triangulation method to quantitatively calculate and analyze the surface topography of opaque samples is discussed. A spatial resolution of at least 10 μm in <i>z</i>-direction, 10 μm in <i>x</i>-direction and 25...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-05-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/20/10/2842 |
| _version_ | 1797567827955154944 |
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| author | Zhanpeng Xu Erik Forsberg Yang Guo Fuhong Cai Sailing He |
| author_facet | Zhanpeng Xu Erik Forsberg Yang Guo Fuhong Cai Sailing He |
| author_sort | Zhanpeng Xu |
| collection | DOAJ |
| description | A novel light-sheet microscopy (LSM) system that uses the laser triangulation method to quantitatively calculate and analyze the surface topography of opaque samples is discussed. A spatial resolution of at least 10 μm in <i>z</i>-direction, 10 μm in <i>x</i>-direction and 25 μm in <i>y</i>-direction with a large field-of-view (FOV) is achieved. A set of sample measurements that verify the system′s functionality in various applications are presented. The system has a simple mechanical structure, such that the spatial resolution is easily improved by replacement of the objective, and a linear calibration formula, which enables convenient system calibration. As implemented, the system has strong potential for, e.g., industrial sample line inspections, however, since the method utilizes reflected/scattered light, it also has the potential for three-dimensional analysis of translucent and layered structures. |
| first_indexed | 2024-03-10T19:47:05Z |
| format | Article |
| id | doaj.art-cbbe80275fdd41df91dd60899cdc29d3 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T19:47:05Z |
| publishDate | 2020-05-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-cbbe80275fdd41df91dd60899cdc29d32023-11-20T00:42:49ZengMDPI AGSensors1424-82202020-05-012010284210.3390/s20102842Light-Sheet Microscopy for Surface Topography Measurements and Quantitative AnalysisZhanpeng Xu0Erik Forsberg1Yang Guo2Fuhong Cai3Sailing He4Centre for Optical and Electromagnetic Research, National Engineering Research Center for Optical Instruments, Zhejiang Provincial Key Laboratory for Sensing Technologies, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, ChinaCentre for Optical and Electromagnetic Research, National Engineering Research Center for Optical Instruments, Zhejiang Provincial Key Laboratory for Sensing Technologies, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, ChinaCentre for Optical and Electromagnetic Research, National Engineering Research Center for Optical Instruments, Zhejiang Provincial Key Laboratory for Sensing Technologies, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, ChinaSchool of Biomedical Engineering, Hainan University, Haikou 570228, ChinaCentre for Optical and Electromagnetic Research, National Engineering Research Center for Optical Instruments, Zhejiang Provincial Key Laboratory for Sensing Technologies, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, ChinaA novel light-sheet microscopy (LSM) system that uses the laser triangulation method to quantitatively calculate and analyze the surface topography of opaque samples is discussed. A spatial resolution of at least 10 μm in <i>z</i>-direction, 10 μm in <i>x</i>-direction and 25 μm in <i>y</i>-direction with a large field-of-view (FOV) is achieved. A set of sample measurements that verify the system′s functionality in various applications are presented. The system has a simple mechanical structure, such that the spatial resolution is easily improved by replacement of the objective, and a linear calibration formula, which enables convenient system calibration. As implemented, the system has strong potential for, e.g., industrial sample line inspections, however, since the method utilizes reflected/scattered light, it also has the potential for three-dimensional analysis of translucent and layered structures.https://www.mdpi.com/1424-8220/20/10/2842light-sheet microscopy (LSM)laser triangulationsurface topographyline scanning3D reconstructionquantitative analysis |
| spellingShingle | Zhanpeng Xu Erik Forsberg Yang Guo Fuhong Cai Sailing He Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis Sensors light-sheet microscopy (LSM) laser triangulation surface topography line scanning 3D reconstruction quantitative analysis |
| title | Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis |
| title_full | Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis |
| title_fullStr | Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis |
| title_full_unstemmed | Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis |
| title_short | Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis |
| title_sort | light sheet microscopy for surface topography measurements and quantitative analysis |
| topic | light-sheet microscopy (LSM) laser triangulation surface topography line scanning 3D reconstruction quantitative analysis |
| url | https://www.mdpi.com/1424-8220/20/10/2842 |
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