MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD

Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image qual...

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Main Authors: Patricia Donnadieu, Kenji Matsuda, Thierry Epicier, Joel Douin
Format: Article
Language:English
Published: Slovenian Society for Stereology and Quantitative Image Analysis 2011-05-01
Series:Image Analysis and Stereology
Subjects:
Online Access:http://www.ias-iss.org/ojs/IAS/article/view/682
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author Patricia Donnadieu
Kenji Matsuda
Thierry Epicier
Joel Douin
author_facet Patricia Donnadieu
Kenji Matsuda
Thierry Epicier
Joel Douin
author_sort Patricia Donnadieu
collection DOAJ
description Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.
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spelling doaj.art-cbc6b0b386d04196b3b809c5b5efee9c2022-12-22T03:46:10ZengSlovenian Society for Stereology and Quantitative Image AnalysisImage Analysis and Stereology1580-31391854-51652011-05-0120321321810.5566/ias.v20.p213-218654MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHODPatricia DonnadieuKenji MatsudaThierry EpicierJoel DouinOwing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.http://www.ias-iss.org/ojs/IAS/article/view/682displacement fieldHREMphase image
spellingShingle Patricia Donnadieu
Kenji Matsuda
Thierry Epicier
Joel Douin
MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
Image Analysis and Stereology
displacement field
HREM
phase image
title MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
title_full MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
title_fullStr MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
title_full_unstemmed MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
title_short MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD
title_sort measurements of strain fields due to nanoscale precipitates using the phase image method
topic displacement field
HREM
phase image
url http://www.ias-iss.org/ojs/IAS/article/view/682
work_keys_str_mv AT patriciadonnadieu measurementsofstrainfieldsduetonanoscaleprecipitatesusingthephaseimagemethod
AT kenjimatsuda measurementsofstrainfieldsduetonanoscaleprecipitatesusingthephaseimagemethod
AT thierryepicier measurementsofstrainfieldsduetonanoscaleprecipitatesusingthephaseimagemethod
AT joeldouin measurementsofstrainfieldsduetonanoscaleprecipitatesusingthephaseimagemethod