Manufacturing technology for contacts to silicon carbide
The authors classified the results of investigations of resistivity of ohmic contacts to silicon carbide made without any semiconductor surface modification. A set of contacts with better parameters were analysed. From the results of this analysis, some recommendations were made concerning optimal c...
Main Authors: | Kudryk Ya.Ya., Bigun R. I., Kudryk R. Ya. |
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Format: | Article |
Language: | English |
Published: |
Politehperiodika
2013-02-01
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Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
Subjects: | |
Online Access: | http://www.tkea.com.ua/tkea/2013/1_2013/pdf/05.zip |
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