Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation

Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical...

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Main Authors: ANDREJA VALCIC, RADOS GAJIC, STEVAN DJURIC, SLOBODANKA NIKOLIC, ALEKSANDAR GOLUBOVIC
Format: Article
Language:English
Published: Serbian Chemical Society 1999-09-01
Series:Journal of the Serbian Chemical Society
Subjects:
Online Access:http://www.shd.org.yu/HtDocs/SHD/Vol64/No9-Pdf/V64-no9-07.zip
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author ANDREJA VALCIC
RADOS GAJIC
STEVAN DJURIC
SLOBODANKA NIKOLIC
ALEKSANDAR GOLUBOVIC
author_facet ANDREJA VALCIC
RADOS GAJIC
STEVAN DJURIC
SLOBODANKA NIKOLIC
ALEKSANDAR GOLUBOVIC
author_sort ANDREJA VALCIC
collection DOAJ
description Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data.
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spelling doaj.art-cc18e52c8df74610b035b9397702862b2022-12-21T22:38:51ZengSerbian Chemical SocietyJournal of the Serbian Chemical Society0352-51391999-09-01649553561Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisationANDREJA VALCICRADOS GAJICSTEVAN DJURICSLOBODANKA NIKOLICALEKSANDAR GOLUBOVICSingle crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data.http://www.shd.org.yu/HtDocs/SHD/Vol64/No9-Pdf/V64-no9-07.zipbismuth silicon oxide single crystalsCzochralski techniquecritical diameterciritical rate of rotationetching solutionoptical properties
spellingShingle ANDREJA VALCIC
RADOS GAJIC
STEVAN DJURIC
SLOBODANKA NIKOLIC
ALEKSANDAR GOLUBOVIC
Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
Journal of the Serbian Chemical Society
bismuth silicon oxide single crystals
Czochralski technique
critical diameter
ciritical rate of rotation
etching solution
optical properties
title Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
title_full Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
title_fullStr Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
title_full_unstemmed Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
title_short Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
title_sort single crystals of bismuth silicon oxide grown by the czochralski technique and their characterisation
topic bismuth silicon oxide single crystals
Czochralski technique
critical diameter
ciritical rate of rotation
etching solution
optical properties
url http://www.shd.org.yu/HtDocs/SHD/Vol64/No9-Pdf/V64-no9-07.zip
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