Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation
Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical...
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Serbian Chemical Society
1999-09-01
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Series: | Journal of the Serbian Chemical Society |
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Online Access: | http://www.shd.org.yu/HtDocs/SHD/Vol64/No9-Pdf/V64-no9-07.zip |
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author | ANDREJA VALCIC RADOS GAJIC STEVAN DJURIC SLOBODANKA NIKOLIC ALEKSANDAR GOLUBOVIC |
author_facet | ANDREJA VALCIC RADOS GAJIC STEVAN DJURIC SLOBODANKA NIKOLIC ALEKSANDAR GOLUBOVIC |
author_sort | ANDREJA VALCIC |
collection | DOAJ |
description | Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data. |
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format | Article |
id | doaj.art-cc18e52c8df74610b035b9397702862b |
institution | Directory Open Access Journal |
issn | 0352-5139 |
language | English |
last_indexed | 2024-12-16T07:52:03Z |
publishDate | 1999-09-01 |
publisher | Serbian Chemical Society |
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series | Journal of the Serbian Chemical Society |
spelling | doaj.art-cc18e52c8df74610b035b9397702862b2022-12-21T22:38:51ZengSerbian Chemical SocietyJournal of the Serbian Chemical Society0352-51391999-09-01649553561Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisationANDREJA VALCICRADOS GAJICSTEVAN DJURICSLOBODANKA NIKOLICALEKSANDAR GOLUBOVICSingle crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data.http://www.shd.org.yu/HtDocs/SHD/Vol64/No9-Pdf/V64-no9-07.zipbismuth silicon oxide single crystalsCzochralski techniquecritical diameterciritical rate of rotationetching solutionoptical properties |
spellingShingle | ANDREJA VALCIC RADOS GAJIC STEVAN DJURIC SLOBODANKA NIKOLIC ALEKSANDAR GOLUBOVIC Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation Journal of the Serbian Chemical Society bismuth silicon oxide single crystals Czochralski technique critical diameter ciritical rate of rotation etching solution optical properties |
title | Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation |
title_full | Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation |
title_fullStr | Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation |
title_full_unstemmed | Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation |
title_short | Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation |
title_sort | single crystals of bismuth silicon oxide grown by the czochralski technique and their characterisation |
topic | bismuth silicon oxide single crystals Czochralski technique critical diameter ciritical rate of rotation etching solution optical properties |
url | http://www.shd.org.yu/HtDocs/SHD/Vol64/No9-Pdf/V64-no9-07.zip |
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