Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique
Highly textured phase pure Cu _2 O thin films have been grown by a simple electrodeposition technique with varying deposition voltages (−0.3 to −1.0 V). The surface morphology characterized by Scanning Electron Microscopy (SEM) revealed that the deposited thin films coherently carpet the underlying...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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IOP Publishing
2024-01-01
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| Series: | ECS Advances |
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| Online Access: | https://doi.org/10.1149/2754-2734/ad2f46 |
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| author | Syed Farid Uddin Farhad Md. Moazzem Hossain Muhammad Shahriar Bashar Nazmul Islam Tanvir Suravi Islam |
| author_facet | Syed Farid Uddin Farhad Md. Moazzem Hossain Muhammad Shahriar Bashar Nazmul Islam Tanvir Suravi Islam |
| author_sort | Syed Farid Uddin Farhad |
| collection | DOAJ |
| description | Highly textured phase pure Cu _2 O thin films have been grown by a simple electrodeposition technique with varying deposition voltages (−0.3 to −1.0 V). The surface morphology characterized by Scanning Electron Microscopy (SEM) revealed that the deposited thin films coherently carpet the underlying substrate and are composed of sharp faceted well-defined grains of 0.5–1.0 μ m sizes. XRD analyses showed that all films are composed of polycrystalline cubic Cu _2 O phase only and have average crystalline domain size in the range of 30–73 nm. The preferred crystalline orientation of phase pure Cu _2 O films was found to be changing from (200) to (111) with increasing cathodic voltages and showed the highest (111) and (200) crystalline texture coefficient while growing at −1.0 and −0.8 V respectively. The optical bandgap of the as-grown samples was calculated in the range of 1.95–2.20 eV using UV–vis Transmission data. The performance of Cu _2 O/FTO photocathodes was tested by estimating LED “ON/OFF” modulated surface photovoltage into a photoelectrochemical cell at a zero bias. |
| first_indexed | 2024-04-25T00:40:05Z |
| format | Article |
| id | doaj.art-cc826fde68724924b2d26e553ce25db6 |
| institution | Directory Open Access Journal |
| issn | 2754-2734 |
| language | English |
| last_indexed | 2024-04-25T00:40:05Z |
| publishDate | 2024-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | ECS Advances |
| spelling | doaj.art-cc826fde68724924b2d26e553ce25db62024-03-12T11:49:11ZengIOP PublishingECS Advances2754-27342024-01-013101300110.1149/2754-2734/ad2f46Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition TechniqueSyed Farid Uddin Farhad0https://orcid.org/0000-0002-0618-8679Md. Moazzem Hossain1Muhammad Shahriar Bashar2Nazmul Islam Tanvir3Suravi Islam4Bangladesh Council of Scientific and Industrial Research (BCSIR), Dhaka 1205, BangladeshBangladesh Council of Scientific and Industrial Research (BCSIR), Dhaka 1205, BangladeshBangladesh Council of Scientific and Industrial Research (BCSIR), Dhaka 1205, BangladeshBangladesh Council of Scientific and Industrial Research (BCSIR), Dhaka 1205, BangladeshBangladesh Council of Scientific and Industrial Research (BCSIR), Dhaka 1205, BangladeshHighly textured phase pure Cu _2 O thin films have been grown by a simple electrodeposition technique with varying deposition voltages (−0.3 to −1.0 V). The surface morphology characterized by Scanning Electron Microscopy (SEM) revealed that the deposited thin films coherently carpet the underlying substrate and are composed of sharp faceted well-defined grains of 0.5–1.0 μ m sizes. XRD analyses showed that all films are composed of polycrystalline cubic Cu _2 O phase only and have average crystalline domain size in the range of 30–73 nm. The preferred crystalline orientation of phase pure Cu _2 O films was found to be changing from (200) to (111) with increasing cathodic voltages and showed the highest (111) and (200) crystalline texture coefficient while growing at −1.0 and −0.8 V respectively. The optical bandgap of the as-grown samples was calculated in the range of 1.95–2.20 eV using UV–vis Transmission data. The performance of Cu _2 O/FTO photocathodes was tested by estimating LED “ON/OFF” modulated surface photovoltage into a photoelectrochemical cell at a zero bias.https://doi.org/10.1149/2754-2734/ad2f46electrodeposition - semiconductorsphysical properties of optoelectronic materialsthin film growth |
| spellingShingle | Syed Farid Uddin Farhad Md. Moazzem Hossain Muhammad Shahriar Bashar Nazmul Islam Tanvir Suravi Islam Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique ECS Advances electrodeposition - semiconductors physical properties of optoelectronic materials thin film growth |
| title | Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique |
| title_full | Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique |
| title_fullStr | Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique |
| title_full_unstemmed | Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique |
| title_short | Communication—Texture and Bandgap Tuning of Phase Pure Cu2O Thin Films Grown by a Simple Potentiostatic Electrodeposition Technique |
| title_sort | communication texture and bandgap tuning of phase pure cu2o thin films grown by a simple potentiostatic electrodeposition technique |
| topic | electrodeposition - semiconductors physical properties of optoelectronic materials thin film growth |
| url | https://doi.org/10.1149/2754-2734/ad2f46 |
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