Compression-Assisted Adaptive ECC and RAID Scattering for NAND Flash Storage Devices
NAND flash memory-based storage devices are vulnerable to errors induced by NAND flash memory cells. Error-correction codes (ECCs) are integrated into the flash memory controller to correct errors in flash memory. However, since ECCs show inherent limits in checking the excessive increase in errors,...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-05-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/20/10/2952 |