End-condition for solution small angle X-ray scattering measurements by kernel density estimation

We develop a method for calculating the minimum X-ray exposure time for X-ray solution scattering experiments using statistical and mathematical approaches to enhance the measurement efficiency while maintaining data quality. Experts can determine the X-ray exposure time for samples by investigating...

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Bibliographic Details
Main Authors: Hiroshi Sekiguchi, Noboru Ohta, Hideaki Ishibashi, Hideitsu Hino, Masaichiro Mizumaki
Format: Article
Language:English
Published: Taylor & Francis Group 2022-12-01
Series:Science and Technology of Advanced Materials: Methods
Subjects:
Online Access:http://dx.doi.org/10.1080/27660400.2022.2140021
Description
Summary:We develop a method for calculating the minimum X-ray exposure time for X-ray solution scattering experiments using statistical and mathematical approaches to enhance the measurement efficiency while maintaining data quality. Experts can determine the X-ray exposure time for samples by investigating time-series data of scattering profiles and considering the quality of scattering profiles and the samples’ X-ray damage. In this study, we apply a statistical inequality to estimate the kernel density estimation method’s error to determine the minimum X-ray exposure time for protein solution scattering experiments and evaluate the method’s validity using the results of Guinier analysis as an indicator.
ISSN:2766-0400