End-condition for solution small angle X-ray scattering measurements by kernel density estimation
We develop a method for calculating the minimum X-ray exposure time for X-ray solution scattering experiments using statistical and mathematical approaches to enhance the measurement efficiency while maintaining data quality. Experts can determine the X-ray exposure time for samples by investigating...
Main Authors: | Hiroshi Sekiguchi, Noboru Ohta, Hideaki Ishibashi, Hideitsu Hino, Masaichiro Mizumaki |
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Format: | Article |
Language: | English |
Published: |
Taylor & Francis Group
2022-12-01
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Series: | Science and Technology of Advanced Materials: Methods |
Subjects: | |
Online Access: | http://dx.doi.org/10.1080/27660400.2022.2140021 |
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