Enhancing Metric-Based Few-Shot Classification With Weighted Large Margin Nearest Center Loss
Metric-learning-based methods, which attempt to learn a deep embedding space on extremely large episodes, have been successfully applied to few-shot classification problems. In this paper, we propose the adoption of large margin nearest center (LMNC) loss during episodic training to enhance metric-l...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9462843/ |