The study of radiation damage of EPROM 2764 memory
A simple statistical theory of radiation damage of semiconductor memory has been constructed. The radiation damage of EPROM memory has been investigated. The measured number of damaged bytes is significantly lower than the expected number resulting from the purely random distribution of the...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
VINCA Institute of Nuclear Sciences
2016-01-01
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| Series: | Nuclear Technology and Radiation Protection |
| Subjects: | |
| Online Access: | http://www.doiserbia.nb.rs/img/doi/1451-3994/2016/1451-39941603233D.pdf |
| Summary: | A simple statistical theory of radiation damage of semiconductor memory has
been constructed. The radiation damage of EPROM memory has been investigated.
The measured number of damaged bytes is significantly lower than the expected
number resulting from the purely random distribution of the damaged bits. In
this way it has been proven that there is a correlation between the failures
of individual memory bits which are located in the same byte. |
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| ISSN: | 1451-3994 1452-8185 |