Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications
With the constant need for the development of smart devices, Micro-Electro-Mechanical Systems (MEMS) based smart sensors have been developed to detect hazard materials, micro-particles or even toxic substances. Identifying small particles using such micro-engineering technology requires designing se...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-06-01
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| Series: | Micromachines |
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| Online Access: | https://www.mdpi.com/2072-666X/13/7/989 |
| _version_ | 1797445161424257024 |
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| author | Ayman M. Alneamy Hassen M. Ouakad |
| author_facet | Ayman M. Alneamy Hassen M. Ouakad |
| author_sort | Ayman M. Alneamy |
| collection | DOAJ |
| description | With the constant need for the development of smart devices, Micro-Electro-Mechanical Systems (MEMS) based smart sensors have been developed to detect hazard materials, micro-particles or even toxic substances. Identifying small particles using such micro-engineering technology requires designing sensors with high sensitivity, selectivity and ease of integration with other electronic components. Nevertheless, the available detection mechanism designs are still juvenile and need more innovative ideas to be even more competitive. Therefore, this work aims to introduce a novel, smart and innovative micro-sensor design consisting of two weakly electrostatically coupled microbeams (both serving as sensors) and electrically excited using a stationary electrode assuming a dc/ac electric signal. The sensor design can be tuned from straight to eventually initially curved microbeams. Such an arrangement would develop certain nonlinear phenomena, such as the snap-through motion. This behavior would portray certain mode veering/mode crossing and ultimately mode localization and it would certainly lead in increasing the sensitivity of the mode-localized based sensing mechanism. These can be achieved by tracking the change in the resonance frequencies of the two microbeams as the coupling control parameter is varied. To this extent, a nonlinear model of the design is presented, and then a reduced-order model considering all geometric and electrical nonlinearities is established. A Long-Time Integration (LTI) method is utilized to solve the static and dynamics of the coupled resonators under primary lower-order and higher-order resonances, respectively. It is shown that the system can display veering and mode coupling in the vicinity of the primary resonances of both beams. Such detected modal interactions lead to an increase in the sensitivity of the sensor design. In addition, the use of two different beam’s configurations in one device uncovered a possibility of using this design in detecting two potential substances at the same time using the two interacting resonant peaks. |
| first_indexed | 2024-03-09T13:22:46Z |
| format | Article |
| id | doaj.art-cede08c4719c49e79d2f5bf928c22edc |
| institution | Directory Open Access Journal |
| issn | 2072-666X |
| language | English |
| last_indexed | 2024-03-09T13:22:46Z |
| publishDate | 2022-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Micromachines |
| spelling | doaj.art-cede08c4719c49e79d2f5bf928c22edc2023-11-30T21:28:35ZengMDPI AGMicromachines2072-666X2022-06-0113798910.3390/mi13070989Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing ApplicationsAyman M. Alneamy0Hassen M. Ouakad1Department of Mechanical Engineering, Jazan University, Jazan 45142, Saudi ArabiaDepartment of Mechanical and Industrial Engineering, Sultan Qaboos University, Al-Khoudh, P.O. Box 33, Muscat 123, OmanWith the constant need for the development of smart devices, Micro-Electro-Mechanical Systems (MEMS) based smart sensors have been developed to detect hazard materials, micro-particles or even toxic substances. Identifying small particles using such micro-engineering technology requires designing sensors with high sensitivity, selectivity and ease of integration with other electronic components. Nevertheless, the available detection mechanism designs are still juvenile and need more innovative ideas to be even more competitive. Therefore, this work aims to introduce a novel, smart and innovative micro-sensor design consisting of two weakly electrostatically coupled microbeams (both serving as sensors) and electrically excited using a stationary electrode assuming a dc/ac electric signal. The sensor design can be tuned from straight to eventually initially curved microbeams. Such an arrangement would develop certain nonlinear phenomena, such as the snap-through motion. This behavior would portray certain mode veering/mode crossing and ultimately mode localization and it would certainly lead in increasing the sensitivity of the mode-localized based sensing mechanism. These can be achieved by tracking the change in the resonance frequencies of the two microbeams as the coupling control parameter is varied. To this extent, a nonlinear model of the design is presented, and then a reduced-order model considering all geometric and electrical nonlinearities is established. A Long-Time Integration (LTI) method is utilized to solve the static and dynamics of the coupled resonators under primary lower-order and higher-order resonances, respectively. It is shown that the system can display veering and mode coupling in the vicinity of the primary resonances of both beams. Such detected modal interactions lead to an increase in the sensitivity of the sensor design. In addition, the use of two different beam’s configurations in one device uncovered a possibility of using this design in detecting two potential substances at the same time using the two interacting resonant peaks.https://www.mdpi.com/2072-666X/13/7/989MEMSveeringmode-localizationsnap-throughcrossing |
| spellingShingle | Ayman M. Alneamy Hassen M. Ouakad Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications Micromachines MEMS veering mode-localization snap-through crossing |
| title | Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications |
| title_full | Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications |
| title_fullStr | Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications |
| title_full_unstemmed | Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications |
| title_short | Investigation into Mode Localization of Electrostatically Coupled Shallow Microbeams for Potential Sensing Applications |
| title_sort | investigation into mode localization of electrostatically coupled shallow microbeams for potential sensing applications |
| topic | MEMS veering mode-localization snap-through crossing |
| url | https://www.mdpi.com/2072-666X/13/7/989 |
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