| Summary: | Surface plasmon resonance sensors (SPR) using copper for sensitive parts are a competitive alternative to gold and silver. Copper oxide is a semiconductor and has a non-toxic nature. The unavoidable presence of copper oxide may be of interest as it is non-toxic, but it modifies the condition of resonance and the performance of the sensor. Therefore, the characterization of the optical properties of copper and copper oxide thin films is of interest. We propose a method to recover both the thicknesses and optical properties of copper and copper oxide from absorbance curves over the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mo>(</mo><mn>0.9</mn><mo>;</mo><mn>3.5</mn><mo>)</mo></mrow></semantics></math></inline-formula> eV range, and we use these results to numerically investigate the surface plasmon resonance of copper/copper oxide thin films. Samples of initial copper thicknesses 10, 30 and 50 nm, after nine successive oxidations, are systematically studied to simulate the signal of a Surface Plasmon Resonance setup. The results obtained from the resolution of the inverse problem of absorbance are used to discuss the performance of a copper-oxide sensor and, therefore, to evaluate the optimal thicknesses.
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