Strain-induced damage analysis of hyperelastic material through scanning electron microscopy: A statistical approach using digital image processing
In order to acquire topographic/morphological images with superior resolution and depth of focus than an ordinary optical microscope, scanning electron microscopy (SEM) is used to take photographs of a surface of materials or specimens at a desired point. In the context of polymer and rubber materia...
| Автори: | , , |
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| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Elsevier
2023-08-01
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| Серія: | Forces in Mechanics |
| Предмети: | |
| Онлайн доступ: | http://www.sciencedirect.com/science/article/pii/S2666359723000604 |