Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction

The phase and texture of a newly developed solution-processed copper phthalocyanine (CuPc) thin film have been investigated by two-dimensional grazing incidence X-ray diffraction. The results show that it has β phase crystalline structure, with crystallinity greater than 80%. The average size of the...

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Main Authors: Lulu Deng, Kewei Wang, Cindy X. Zhao, Han Yan, James F. Britten, Gu Xu
Format: Article
Language:English
Published: MDPI AG 2011-07-01
Series:Crystals
Subjects:
Online Access:http://www.mdpi.com/2073-4352/1/3/112
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author Lulu Deng
Kewei Wang
Cindy X. Zhao
Han Yan
James F. Britten
Gu Xu
author_facet Lulu Deng
Kewei Wang
Cindy X. Zhao
Han Yan
James F. Britten
Gu Xu
author_sort Lulu Deng
collection DOAJ
description The phase and texture of a newly developed solution-processed copper phthalocyanine (CuPc) thin film have been investigated by two-dimensional grazing incidence X-ray diffraction. The results show that it has β phase crystalline structure, with crystallinity greater than 80%. The average size of the crystallites is found to be about 24 nm. There are two different arrangements of crystallites, with one dominating the diffraction pattern. Both of them have preferred orientation along the thin film normal. Based on the similarities to the vacuum deposited CuPc thin films, the new solution processing method is verified to offer a good alternative to vacuum process, for the fabrication of low cost small molecule based organic photovoltaics.
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spelling doaj.art-cf683989f90546538831e5ff11faa6802022-12-22T04:22:36ZengMDPI AGCrystals2073-43522011-07-011311211910.3390/cryst1030112Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray DiffractionLulu DengKewei WangCindy X. ZhaoHan YanJames F. BrittenGu XuThe phase and texture of a newly developed solution-processed copper phthalocyanine (CuPc) thin film have been investigated by two-dimensional grazing incidence X-ray diffraction. The results show that it has β phase crystalline structure, with crystallinity greater than 80%. The average size of the crystallites is found to be about 24 nm. There are two different arrangements of crystallites, with one dominating the diffraction pattern. Both of them have preferred orientation along the thin film normal. Based on the similarities to the vacuum deposited CuPc thin films, the new solution processing method is verified to offer a good alternative to vacuum process, for the fabrication of low cost small molecule based organic photovoltaics.http://www.mdpi.com/2073-4352/1/3/112solution processingcopper phthalocyaninegrazing incidence X-ray diffraction
spellingShingle Lulu Deng
Kewei Wang
Cindy X. Zhao
Han Yan
James F. Britten
Gu Xu
Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction
Crystals
solution processing
copper phthalocyanine
grazing incidence X-ray diffraction
title Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction
title_full Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction
title_fullStr Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction
title_full_unstemmed Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction
title_short Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction
title_sort phase and texture of solution processed copper phthalocyanine thin films investigated by two dimensional grazing incidence x ray diffraction
topic solution processing
copper phthalocyanine
grazing incidence X-ray diffraction
url http://www.mdpi.com/2073-4352/1/3/112
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