Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography

Due to the high-accuracy requirement of dimensional measurements for thin-walled structures of additive manufacturing products, the grayscale distribution of the industrial CT image and the location of the structural boundaries in the image space were derived. In addition, the validity of the half-h...

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Main Authors: CHEN Zi-mu, HU Zheng-wei, WANG Qian-ni, SHI Yi-wei
Format: Article
Language:zho
Published: Journal of Materials Engineering 2020-08-01
Series:Cailiao gongcheng
Subjects:
Online Access:http://jme.biam.ac.cn/CN/Y2020/V48/I8/169
_version_ 1797967195596128256
author CHEN Zi-mu
HU Zheng-wei
WANG Qian-ni
SHI Yi-wei
author_facet CHEN Zi-mu
HU Zheng-wei
WANG Qian-ni
SHI Yi-wei
author_sort CHEN Zi-mu
collection DOAJ
description Due to the high-accuracy requirement of dimensional measurements for thin-walled structures of additive manufacturing products, the grayscale distribution of the industrial CT image and the location of the structural boundaries in the image space were derived. In addition, the validity of the half-height-width method and the maximum gradient method was compared and analyzed, and the limit of the dimensional measurement based on CT imaging was calculated. The thin-walled structures with different thicknesses were calibrated, and measured by industrial CT scanning and imaging experiment. The results show that the half-height-width method generates a smaller error compared with the maximum gradient method, when the thickness of the thin-walled structures is larger than the measurement limit of the CT system. Finally, the measurement limit can be obtained by numerical simulations based on the edge spread function with experimental measurements.
first_indexed 2024-04-11T02:26:17Z
format Article
id doaj.art-cff11cb9347b4e45b1d77fef52d2f0db
institution Directory Open Access Journal
issn 1001-4381
1001-4381
language zho
last_indexed 2024-04-11T02:26:17Z
publishDate 2020-08-01
publisher Journal of Materials Engineering
record_format Article
series Cailiao gongcheng
spelling doaj.art-cff11cb9347b4e45b1d77fef52d2f0db2023-01-02T22:37:15ZzhoJournal of Materials EngineeringCailiao gongcheng1001-43811001-43812020-08-0148816917610.11868/j.issn.1001-4381.2019.00028620200818Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomographyCHEN Zi-mu0HU Zheng-wei1WANG Qian-ni2SHI Yi-wei3AECC Beijing Institute of Aeronautical Materials, Beijing 100095, China;AECC Beijing Institute of Aeronautical Materials, Beijing 100095, China;AECC Beijing Institute of Aeronautical Materials, Beijing 100095, China;AECC Beijing Institute of Aeronautical Materials, Beijing 100095, China;Due to the high-accuracy requirement of dimensional measurements for thin-walled structures of additive manufacturing products, the grayscale distribution of the industrial CT image and the location of the structural boundaries in the image space were derived. In addition, the validity of the half-height-width method and the maximum gradient method was compared and analyzed, and the limit of the dimensional measurement based on CT imaging was calculated. The thin-walled structures with different thicknesses were calibrated, and measured by industrial CT scanning and imaging experiment. The results show that the half-height-width method generates a smaller error compared with the maximum gradient method, when the thickness of the thin-walled structures is larger than the measurement limit of the CT system. Finally, the measurement limit can be obtained by numerical simulations based on the edge spread function with experimental measurements.http://jme.biam.ac.cn/CN/Y2020/V48/I8/169thin-walled structureindustrial computed tomographydimensional measurementmea-surement limit
spellingShingle CHEN Zi-mu
HU Zheng-wei
WANG Qian-ni
SHI Yi-wei
Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
Cailiao gongcheng
thin-walled structure
industrial computed tomography
dimensional measurement
mea-surement limit
title Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
title_full Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
title_fullStr Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
title_full_unstemmed Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
title_short Error and limit determination for dimensional measurements of thin-walled structures with industrial computed tomography
title_sort error and limit determination for dimensional measurements of thin walled structures with industrial computed tomography
topic thin-walled structure
industrial computed tomography
dimensional measurement
mea-surement limit
url http://jme.biam.ac.cn/CN/Y2020/V48/I8/169
work_keys_str_mv AT chenzimu errorandlimitdeterminationfordimensionalmeasurementsofthinwalledstructureswithindustrialcomputedtomography
AT huzhengwei errorandlimitdeterminationfordimensionalmeasurementsofthinwalledstructureswithindustrialcomputedtomography
AT wangqianni errorandlimitdeterminationfordimensionalmeasurementsofthinwalledstructureswithindustrialcomputedtomography
AT shiyiwei errorandlimitdeterminationfordimensionalmeasurementsofthinwalledstructureswithindustrialcomputedtomography