Combining scanning probe microscopy and x-ray spectroscopy
<p>Abstract</p> <p>A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the vis...
| Main Authors: | , , , , , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2011-01-01
|
| Series: | Nanoscale Research Letters |
| Online Access: | http://www.nanoscalereslett.com/content/6/1/308 |
| _version_ | 1797724430081720320 |
|---|---|
| author | Bjeoumikhov Aniouar Ferrero Sylvain Pailharey Daniel Dahmani Brahim Purans Juris Larcheri Sylvia Graziola Roberto Erko Alexei Zizak Ivo Fauquet Carole Dehlinger Maël Jandard Franck Tonneau Didier |
| author_facet | Bjeoumikhov Aniouar Ferrero Sylvain Pailharey Daniel Dahmani Brahim Purans Juris Larcheri Sylvia Graziola Roberto Erko Alexei Zizak Ivo Fauquet Carole Dehlinger Maël Jandard Franck Tonneau Didier |
| author_sort | Bjeoumikhov Aniouar |
| collection | DOAJ |
| description | <p>Abstract</p> <p>A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO<sub>4 </sub>thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.</p> |
| first_indexed | 2024-03-12T10:17:08Z |
| format | Article |
| id | doaj.art-d00244496ac54d9593fbfe93aa4203d6 |
| institution | Directory Open Access Journal |
| issn | 1931-7573 1556-276X |
| language | English |
| last_indexed | 2024-03-12T10:17:08Z |
| publishDate | 2011-01-01 |
| publisher | SpringerOpen |
| record_format | Article |
| series | Nanoscale Research Letters |
| spelling | doaj.art-d00244496ac54d9593fbfe93aa4203d62023-09-02T10:27:14ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2011-01-0161308Combining scanning probe microscopy and x-ray spectroscopyBjeoumikhov AniouarFerrero SylvainPailharey DanielDahmani BrahimPurans JurisLarcheri SylviaGraziola RobertoErko AlexeiZizak IvoFauquet CaroleDehlinger MaëlJandard FranckTonneau Didier<p>Abstract</p> <p>A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO<sub>4 </sub>thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.</p>http://www.nanoscalereslett.com/content/6/1/308 |
| spellingShingle | Bjeoumikhov Aniouar Ferrero Sylvain Pailharey Daniel Dahmani Brahim Purans Juris Larcheri Sylvia Graziola Roberto Erko Alexei Zizak Ivo Fauquet Carole Dehlinger Maël Jandard Franck Tonneau Didier Combining scanning probe microscopy and x-ray spectroscopy Nanoscale Research Letters |
| title | Combining scanning probe microscopy and x-ray spectroscopy |
| title_full | Combining scanning probe microscopy and x-ray spectroscopy |
| title_fullStr | Combining scanning probe microscopy and x-ray spectroscopy |
| title_full_unstemmed | Combining scanning probe microscopy and x-ray spectroscopy |
| title_short | Combining scanning probe microscopy and x-ray spectroscopy |
| title_sort | combining scanning probe microscopy and x ray spectroscopy |
| url | http://www.nanoscalereslett.com/content/6/1/308 |
| work_keys_str_mv | AT bjeoumikhovaniouar combiningscanningprobemicroscopyandxrayspectroscopy AT ferrerosylvain combiningscanningprobemicroscopyandxrayspectroscopy AT pailhareydaniel combiningscanningprobemicroscopyandxrayspectroscopy AT dahmanibrahim combiningscanningprobemicroscopyandxrayspectroscopy AT puransjuris combiningscanningprobemicroscopyandxrayspectroscopy AT larcherisylvia combiningscanningprobemicroscopyandxrayspectroscopy AT graziolaroberto combiningscanningprobemicroscopyandxrayspectroscopy AT erkoalexei combiningscanningprobemicroscopyandxrayspectroscopy AT zizakivo combiningscanningprobemicroscopyandxrayspectroscopy AT fauquetcarole combiningscanningprobemicroscopyandxrayspectroscopy AT dehlingerma235l combiningscanningprobemicroscopyandxrayspectroscopy AT jandardfranck combiningscanningprobemicroscopyandxrayspectroscopy AT tonneaudidier combiningscanningprobemicroscopyandxrayspectroscopy |