Stateful characterization of resistive switching TiO2 with electron beam induced currents

Oxide-based memristors hold promise for artificial neuromorphic computing, yet the detail of the switching mechanism—filament formation—remains largely unknown. Hoskins et al. provide nanoscale imaging of this process using electron beam induced current microscopy and relate it to resistive states....

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Main Authors: Brian D. Hoskins, Gina C. Adam, Evgheni Strelcov, Nikolai Zhitenev, Andrei Kolmakov, Dmitri B. Strukov, Jabez J. McClelland
Format: Article
Language:English
Published: Nature Portfolio 2017-12-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-017-02116-9
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author Brian D. Hoskins
Gina C. Adam
Evgheni Strelcov
Nikolai Zhitenev
Andrei Kolmakov
Dmitri B. Strukov
Jabez J. McClelland
author_facet Brian D. Hoskins
Gina C. Adam
Evgheni Strelcov
Nikolai Zhitenev
Andrei Kolmakov
Dmitri B. Strukov
Jabez J. McClelland
author_sort Brian D. Hoskins
collection DOAJ
description Oxide-based memristors hold promise for artificial neuromorphic computing, yet the detail of the switching mechanism—filament formation—remains largely unknown. Hoskins et al. provide nanoscale imaging of this process using electron beam induced current microscopy and relate it to resistive states.
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spelling doaj.art-d0fb653e348142e1b8662ad03c0cfa6e2022-12-21T18:03:39ZengNature PortfolioNature Communications2041-17232017-12-018111110.1038/s41467-017-02116-9Stateful characterization of resistive switching TiO2 with electron beam induced currentsBrian D. Hoskins0Gina C. Adam1Evgheni Strelcov2Nikolai Zhitenev3Andrei Kolmakov4Dmitri B. Strukov5Jabez J. McClelland6Center for Nanoscale Science and Technology, National Institute of Standards and TechnologyElectrical and Computer Engineering Department, University of California Santa BarbaraCenter for Nanoscale Science and Technology, National Institute of Standards and TechnologyCenter for Nanoscale Science and Technology, National Institute of Standards and TechnologyCenter for Nanoscale Science and Technology, National Institute of Standards and TechnologyElectrical and Computer Engineering Department, University of California Santa BarbaraCenter for Nanoscale Science and Technology, National Institute of Standards and TechnologyOxide-based memristors hold promise for artificial neuromorphic computing, yet the detail of the switching mechanism—filament formation—remains largely unknown. Hoskins et al. provide nanoscale imaging of this process using electron beam induced current microscopy and relate it to resistive states.https://doi.org/10.1038/s41467-017-02116-9
spellingShingle Brian D. Hoskins
Gina C. Adam
Evgheni Strelcov
Nikolai Zhitenev
Andrei Kolmakov
Dmitri B. Strukov
Jabez J. McClelland
Stateful characterization of resistive switching TiO2 with electron beam induced currents
Nature Communications
title Stateful characterization of resistive switching TiO2 with electron beam induced currents
title_full Stateful characterization of resistive switching TiO2 with electron beam induced currents
title_fullStr Stateful characterization of resistive switching TiO2 with electron beam induced currents
title_full_unstemmed Stateful characterization of resistive switching TiO2 with electron beam induced currents
title_short Stateful characterization of resistive switching TiO2 with electron beam induced currents
title_sort stateful characterization of resistive switching tio2 with electron beam induced currents
url https://doi.org/10.1038/s41467-017-02116-9
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