| Summary: | Due to the scarcity of labeled samples, the class prototype obtained by support set samples is difficult to represent the real distribution of the whole class in metric-based few-shot image classification methods. Meanwhile, samples of the same class may also have large difference in many aspects and the large intra-class bias may make the sample features deviate from the class center. Aiming at the above problems that may seriously affect the performance, a few-shot image classification method with feature maps enhancement prototype (FMEP) is proposed. Firstly, this paper selects some similar features of the query set sample feature maps with cosine similarity and adds them to class prototypes to obtain more representative prototypes. Secondly, this paper aggregates similar features of the query set to alleviate the problem caused by large intra-class bias and makes features distribution of the same class closer. Finally, this paper compares enhanced prototypes and aggregated features which are both closer to real distribution to get better results. The proposed method is tested on four commonly used few-shot classification datasets, namely MiniImageNet, TieredImageNet, CUB-200 and CIFAR-FS. The results show that the proposed method can not only improve the performance of the baseline model, but also obtain better performance compared with the same type of methods.
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