Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz
New wireless technologies significantly utilize the spectrum around 6 GHz with some of them, like Wi-Fi®6E, using both the spectrum below and above 6 GHz. At these frequencies, the main challenge for electromagnetic field (EMF) exposure assessments is due to the exposure metric changing f...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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IEEE
2023-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10159216/ |
| _version_ | 1797776959743197184 |
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| author | Walid El Hajj John Roman Zhen Yao Robert Paxman Valerio De Santis |
| author_facet | Walid El Hajj John Roman Zhen Yao Robert Paxman Valerio De Santis |
| author_sort | Walid El Hajj |
| collection | DOAJ |
| description | New wireless technologies significantly utilize the spectrum around 6 GHz with some of them, like Wi-Fi®6E, using both the spectrum below and above 6 GHz. At these frequencies, the main challenge for electromagnetic field (EMF) exposure assessments is due to the exposure metric changing from specific absorption rate (SAR) to absorbed power density (APD). Moreover, due to current measurement limitations, the incident power density (IPD) rather than APD is used in practice. In this context, the maximum allowed output power to ensure exposure compliance is dependent on the metric used and can lead to a discontinuity below and above 6 GHz even for different channels of the same technology. This paper studies such a discontinuity at the transition frequency of 6 GHz using a dipole antenna and a Planar Inverted F Antenna (PIFA). The study was performed at several exposure distances by means of numerical simulations as well as experimental measurements. The assessment was based on the comparison between maximum power values obtained while remaining compliant to the SAR and IPD limits for the same exposure conditions. The results have shown that for a specific source there was a distance (between 5 and 10 mm) where the highest power reduction for compliance switched from SAR to IPD. The difference or discontinuity level varied between 2 and 6 dB depending on the exposure distance and the source. In summary, SAR is more restrictive at closer distances, while the IPD induces a higher back-off power with an increase in distance. |
| first_indexed | 2024-03-12T22:57:17Z |
| format | Article |
| id | doaj.art-d131a901c24b4d84b125a824f6f953d6 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-03-12T22:57:17Z |
| publishDate | 2023-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-d131a901c24b4d84b125a824f6f953d62023-07-19T23:00:20ZengIEEEIEEE Access2169-35362023-01-0111621746217910.1109/ACCESS.2023.328469010159216Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHzWalid El Hajj0https://orcid.org/0000-0002-2363-2313John Roman1https://orcid.org/0000-0001-7550-6805Zhen Yao2Robert Paxman3https://orcid.org/0009-0003-6225-0558Valerio De Santis4https://orcid.org/0000-0001-6223-744XIntel Corporation, Antibes, FranceIntel Corporation, Hillsboro, OR, USAIntel Corporation, Hillsboro, OR, USAIntel Corporation, Hillsboro, OR, USADepartment of Industrial and Information Engineering and Economics, University of L’Aquila, L’Aquila, ItalyNew wireless technologies significantly utilize the spectrum around 6 GHz with some of them, like Wi-Fi®6E, using both the spectrum below and above 6 GHz. At these frequencies, the main challenge for electromagnetic field (EMF) exposure assessments is due to the exposure metric changing from specific absorption rate (SAR) to absorbed power density (APD). Moreover, due to current measurement limitations, the incident power density (IPD) rather than APD is used in practice. In this context, the maximum allowed output power to ensure exposure compliance is dependent on the metric used and can lead to a discontinuity below and above 6 GHz even for different channels of the same technology. This paper studies such a discontinuity at the transition frequency of 6 GHz using a dipole antenna and a Planar Inverted F Antenna (PIFA). The study was performed at several exposure distances by means of numerical simulations as well as experimental measurements. The assessment was based on the comparison between maximum power values obtained while remaining compliant to the SAR and IPD limits for the same exposure conditions. The results have shown that for a specific source there was a distance (between 5 and 10 mm) where the highest power reduction for compliance switched from SAR to IPD. The difference or discontinuity level varied between 2 and 6 dB depending on the exposure distance and the source. In summary, SAR is more restrictive at closer distances, while the IPD induces a higher back-off power with an increase in distance.https://ieeexplore.ieee.org/document/10159216/5Gcompliance assessmentEMF exposureincident power densityspecific absorption ratestandardization |
| spellingShingle | Walid El Hajj John Roman Zhen Yao Robert Paxman Valerio De Santis Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz IEEE Access 5G compliance assessment EMF exposure incident power density specific absorption rate standardization |
| title | Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz |
| title_full | Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz |
| title_fullStr | Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz |
| title_full_unstemmed | Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz |
| title_short | Investigation of Power Levels Related to Different EMF Exposure Metrics at 6 GHz |
| title_sort | investigation of power levels related to different emf exposure metrics at 6 ghz |
| topic | 5G compliance assessment EMF exposure incident power density specific absorption rate standardization |
| url | https://ieeexplore.ieee.org/document/10159216/ |
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