Temperature Effect on the Growth Rate and Physical Characteristics of SnO2 Thin Films Grown by Atomic Layer Deposition
Among the various thin film coating techniques, atomic layer deposition (ALD) has features of good controllability of the thickness, excellent step-coverage in 3-dimensional object even in the sub-nm thickness range at the relatively low deposition temperature. In this study, SnO2 thin films were gr...
Main Authors: | Daeho Kim, Dong Ha Kim, Doh-Hyung Riu, Byung Joon Choi |
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Format: | Article |
Language: | English |
Published: |
Polish Academy of Sciences
2018-06-01
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Series: | Archives of Metallurgy and Materials |
Subjects: | |
Online Access: | https://journals.pan.pl/Content/106723/PDF/AMM-2018-2-69-Choi.pdf |
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