Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam

In this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL). The morphology of the samples was analyzed using a scanning electr...

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Main Authors: J. W. Menezes, L. A. M. Barea, E. F. Chillcce, N. Frateschi, L. Cescato
Format: Article
Language:English
Published: IEEE 2012-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/6166841/
_version_ 1818718070002155520
author J. W. Menezes
L. A. M. Barea
E. F. Chillcce
N. Frateschi
L. Cescato
author_facet J. W. Menezes
L. A. M. Barea
E. F. Chillcce
N. Frateschi
L. Cescato
author_sort J. W. Menezes
collection DOAJ
description In this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL). The morphology of the samples was analyzed using a scanning electron microscope (SEM), and the plasmonic peaks were measured from the transmission spectrum of the samples. The diameters of the holes recorded by IL present approximately the same statistical deviation as those fabricated by FIB but in a much larger area. Although the transmittance measurements of both types of samples exhibit the characteristic plasmonic peaks, the intrinsic fabrication errors of each technique affect differently the optical spectra.
first_indexed 2024-12-17T19:45:12Z
format Article
id doaj.art-d218708f1fb54b66a7f83aec796162b5
institution Directory Open Access Journal
issn 1943-0655
language English
last_indexed 2024-12-17T19:45:12Z
publishDate 2012-01-01
publisher IEEE
record_format Article
series IEEE Photonics Journal
spelling doaj.art-d218708f1fb54b66a7f83aec796162b52022-12-21T21:34:53ZengIEEEIEEE Photonics Journal1943-06552012-01-014254455110.1109/JPHOT.2012.21904976166841Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion BeamJ. W. Menezes0L. A. M. Barea1E. F. Chillcce2N. Frateschi3L. Cescato4Instituto de Física Gleb Wataghin, UNICAMP, Campinas, BrazilInstituto de Física Gleb Wataghin, UNICAMP, Campinas, BrazilInstituto de Física Gleb Wataghin, UNICAMP, Campinas, BrazilInstituto de Física Gleb Wataghin, UNICAMP, Campinas, BrazilInstituto de Física Gleb Wataghin, UNICAMP, Campinas, BrazilIn this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL). The morphology of the samples was analyzed using a scanning electron microscope (SEM), and the plasmonic peaks were measured from the transmission spectrum of the samples. The diameters of the holes recorded by IL present approximately the same statistical deviation as those fabricated by FIB but in a much larger area. Although the transmittance measurements of both types of samples exhibit the characteristic plasmonic peaks, the intrinsic fabrication errors of each technique affect differently the optical spectra.https://ieeexplore.ieee.org/document/6166841/Lithographyinterferencefocused ion beamplasmonics
spellingShingle J. W. Menezes
L. A. M. Barea
E. F. Chillcce
N. Frateschi
L. Cescato
Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
IEEE Photonics Journal
Lithography
interference
focused ion beam
plasmonics
title Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
title_full Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
title_fullStr Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
title_full_unstemmed Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
title_short Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
title_sort comparison of plasmonic arrays of holes recorded by interference lithography and focused ion beam
topic Lithography
interference
focused ion beam
plasmonics
url https://ieeexplore.ieee.org/document/6166841/
work_keys_str_mv AT jwmenezes comparisonofplasmonicarraysofholesrecordedbyinterferencelithographyandfocusedionbeam
AT lambarea comparisonofplasmonicarraysofholesrecordedbyinterferencelithographyandfocusedionbeam
AT efchillcce comparisonofplasmonicarraysofholesrecordedbyinterferencelithographyandfocusedionbeam
AT nfrateschi comparisonofplasmonicarraysofholesrecordedbyinterferencelithographyandfocusedionbeam
AT lcescato comparisonofplasmonicarraysofholesrecordedbyinterferencelithographyandfocusedionbeam