Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam

Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam

In this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL). The morphology of the samples was analyzed using a scanning electr...

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Bibliographic Details
Main Authors: J. W. Menezes, L. A. M. Barea, E. F. Chillcce, N. Frateschi, L. Cescato
Format: Article
Language:English
Published: IEEE 2012-01-01
Series:IEEE Photonics Journal
Subjects:
Lithography
interference
focused ion beam
plasmonics
Online Access:https://ieeexplore.ieee.org/document/6166841/

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