Identification of major QTLs for yield-related traits with improved genetic map in wheat

Identification of major QTLs for yield-related traits with improved genetic map in wheat

IntroductionIdentification of stable major quantitative trait loci (QTLs) for yield-related traits is important for yield potential improvement in wheat breeding.MethodsIn the present study, we genotyped a recombinant inbred line (RIL) population using the Wheat 660K SNP array and constructed a high...

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Bibliographic Details
Main Authors:	Feifei Ma, Yunfeng Xu, Ruifang Wang, Yiping Tong, Aimin Zhang, Dongcheng Liu, Diaoguo An
Format:	Article
Language:	English
Published:	Frontiers Media S.A. 2023-03-01
Series:	Frontiers in Plant Science
Subjects:	wheat high-density linkage map QTL mapping yield-related traits the wheat 660K SNP array
Online Access:	https://www.frontiersin.org/articles/10.3389/fpls.2023.1138696/full

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