Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications

Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications

Single-electron tunneling transistors (SETs) and boxes (SEBs) exploit the phenomenon of Coulomb blockade to achieve unprecedented charge sensitivities. Single-electron boxes, however, despite their simplicity compared to SETs, have rarely been used for practical applications. The main reason for tha...

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Bibliographic Details
Main Authors: Thomas A. Zirkle, Matthew J. Filmer, Jonathan Chisum, Alexei O. Orlov, Eva Dupont-Ferrier, Joffrey Rivard, Matthew Huebner, Marc Sanquer, Xavier Jehl, Gregory L. Snider
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Applied Sciences
Subjects:
single-electron tunneling
single-electron box
tunnel barrier
RF reflectometry
Sisyphus resistance
dynamic capacitance
Online Access:https://www.mdpi.com/2076-3417/10/24/8797

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