Surface and thickness measurement in the Targetlab of GSI
For characterization of targets and foils prepared at the target laboratory as well as for characterization of e.g. degrader or windows of internal customers, different analytical devices are available. Besides a lot of standard equipment, the target laboratory of GSI holds a 3D-measurement system (...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2020-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2020/05/epjconf_intds2018_02002.pdf |
| _version_ | 1818911655646461952 |
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| author | Kindler Birgit Celik Ayik Elif Hübner Annett Lommel Bettina Steiner Jutta Yakusheva Vera |
| author_facet | Kindler Birgit Celik Ayik Elif Hübner Annett Lommel Bettina Steiner Jutta Yakusheva Vera |
| author_sort | Kindler Birgit |
| collection | DOAJ |
| description | For characterization of targets and foils prepared at the target laboratory as well as for characterization of e.g. degrader or windows of internal customers, different analytical devices are available. Besides a lot of standard equipment, the target laboratory of GSI holds a 3D-measurement system (MicroProf®) equipped with optical sensors for measuring surface parameters as well as total thickness variations contact-free. In the paper the measuring principle including the possibilities and features of the MicroProf®-system are explained and some different applications are shown. |
| first_indexed | 2024-12-19T23:02:09Z |
| format | Article |
| id | doaj.art-d325ef6ae865496885a88b442c94b70f |
| institution | Directory Open Access Journal |
| issn | 2100-014X |
| language | English |
| last_indexed | 2024-12-19T23:02:09Z |
| publishDate | 2020-01-01 |
| publisher | EDP Sciences |
| record_format | Article |
| series | EPJ Web of Conferences |
| spelling | doaj.art-d325ef6ae865496885a88b442c94b70f2022-12-21T20:02:28ZengEDP SciencesEPJ Web of Conferences2100-014X2020-01-012290200210.1051/epjconf/202022902002epjconf_intds2018_02002Surface and thickness measurement in the Targetlab of GSIKindler BirgitCelik Ayik ElifHübner AnnettLommel BettinaSteiner JuttaYakusheva VeraFor characterization of targets and foils prepared at the target laboratory as well as for characterization of e.g. degrader or windows of internal customers, different analytical devices are available. Besides a lot of standard equipment, the target laboratory of GSI holds a 3D-measurement system (MicroProf®) equipped with optical sensors for measuring surface parameters as well as total thickness variations contact-free. In the paper the measuring principle including the possibilities and features of the MicroProf®-system are explained and some different applications are shown.https://www.epj-conferences.org/articles/epjconf/pdf/2020/05/epjconf_intds2018_02002.pdf |
| spellingShingle | Kindler Birgit Celik Ayik Elif Hübner Annett Lommel Bettina Steiner Jutta Yakusheva Vera Surface and thickness measurement in the Targetlab of GSI EPJ Web of Conferences |
| title | Surface and thickness measurement in the Targetlab of GSI |
| title_full | Surface and thickness measurement in the Targetlab of GSI |
| title_fullStr | Surface and thickness measurement in the Targetlab of GSI |
| title_full_unstemmed | Surface and thickness measurement in the Targetlab of GSI |
| title_short | Surface and thickness measurement in the Targetlab of GSI |
| title_sort | surface and thickness measurement in the targetlab of gsi |
| url | https://www.epj-conferences.org/articles/epjconf/pdf/2020/05/epjconf_intds2018_02002.pdf |
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