In situ synchrotron X-ray diffraction study of the electrochemical reduction of SiO2 in molten CaCl2
In situ synchrotron X-ray diffraction was used to investigate the electrochemical reduction of SiO2 to Si in molten CaCl2 at 1123 K for the first time. The present technique enabled direct determination of intermediate products at high temperature, without cooling and washing treatments. Based on th...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2020-06-01
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| Series: | Electrochemistry Communications |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S1388248120300916 |