Signal-to-Noise Ratio Analysis for the Voltage-Mode Read-Out of Quartz Tuning Forks in QEPAS Applications

Quartz tuning forks (QTFs) are employed as sensitive elements for gas sensing applications implementing quartz-enhanced photoacoustic spectroscopy. Therefore, proper design of the QTF read-out electronics is required to optimize the signal-to-noise ratio (SNR), and in turn, the minimum detection lim...

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Bibliographic Details
Main Authors: Michele Di Gioia, Luigi Lombardi, Cristoforo Marzocca, Gianvito Matarrese, Giansergio Menduni, Pietro Patimisco, Vincenzo Spagnolo
Format: Article
Language:English
Published: MDPI AG 2023-03-01
Series:Micromachines
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Online Access:https://www.mdpi.com/2072-666X/14/3/619
Description
Summary:Quartz tuning forks (QTFs) are employed as sensitive elements for gas sensing applications implementing quartz-enhanced photoacoustic spectroscopy. Therefore, proper design of the QTF read-out electronics is required to optimize the signal-to-noise ratio (SNR), and in turn, the minimum detection limit of the gas concentration. In this work, we present a theoretical study of the SNR trend in a voltage-mode read-out of QTFs, mainly focusing on the effects of (i) the noise contributions of both the QTF-equivalent resistor and the input bias resistor R<sub>L</sub> of the preamplifier, (ii) the operating frequency, and (iii) the bandwidth (BW) of the lock-in amplifier low-pass filter. A MATLAB model for the main noise contributions was retrieved and then validated by means of SPICE simulations. When the bandwidth of the lock-in filter is sufficiently narrow (BW = 0.5 Hz), the SNR values do not strongly depend on both the operating frequency and R<sub>L</sub> values. On the other hand, when a wider low-pass filter bandwidth is employed (BW = 5 Hz), a sharp SNR peak close to the QTF parallel-resonant frequency is found for large values of R<sub>L</sub> (R<sub>L</sub> > 2 MΩ), whereas for small values of R<sub>L</sub> (R<sub>L</sub> < 2 MΩ), the SNR exhibits a peak around the QTF series-resonant frequency.
ISSN:2072-666X