Real‐Space Observation of Potential Reconstruction at Metallic/Insulating Oxide Interface
Abstract Electric field reconstruction at interfaces plays a crucial role in device performances controlling, for example, Schottky potential barrier and interfacial Rashba effect. Here, scanning transmission electron microscopy (STEM) and ab‐initio calculation are used to estimate the atomic‐scale...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2023-03-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202202165 |