Electrically injected double‐taper semiconductor laser based on parity‐time symmetry

Abstract An electrically injected semiconductor laser based on parity‐time symmetry with a double‐taper structure is fabricated and measured. The double‐taper semiconductor lasers are defined by contact‐type standard photolithography and then etched by inductively coupled plasma. The double‐taper pa...

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Bibliographic Details
Main Authors: Xueyou Wang, Jing Li, Ting Fu, Jingxuan Chen, Yingqiu Dai, Renbo Han, Yufei Wang, Wanhua Zheng
Format: Article
Language:English
Published: Wiley 2022-03-01
Series:Electronics Letters
Online Access:https://doi.org/10.1049/ell2.12401
Description
Summary:Abstract An electrically injected semiconductor laser based on parity‐time symmetry with a double‐taper structure is fabricated and measured. The double‐taper semiconductor lasers are defined by contact‐type standard photolithography and then etched by inductively coupled plasma. The double‐taper parity‐time‐symmetric laser can obtain an output power of more than 0.5W @0.3A, which is significantly higher than the 0.35W@0.3A of the traditional single‐ridge laser. The parity‐time‐symmetric breaking point or exceptional point is tuned below lasing threshold to get narrower linewidth compared with traditional single‐ridge lasers and double‐ridge lasers, and performs single‐lobe far field.
ISSN:0013-5194
1350-911X