Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System

Radio frequency (RF) circuit elements that are traditionally considered to be linear frequently exhibit nonlinear properties that affect the intended operation of many other RF systems. Devices such as RF connectors, antennas, attenuators, resistors, and dissimilar metal junctions generate nonlinear...

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Main Authors: Ram M. Narayanan, Kyle A. Gallagher, Gregory J. Mazzaro, Anthony F. Martone, Kelly D. Sherbondy
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Instruments
Subjects:
Online Access:http://www.mdpi.com/2410-390X/2/3/16
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author Ram M. Narayanan
Kyle A. Gallagher
Gregory J. Mazzaro
Anthony F. Martone
Kelly D. Sherbondy
author_facet Ram M. Narayanan
Kyle A. Gallagher
Gregory J. Mazzaro
Anthony F. Martone
Kelly D. Sherbondy
author_sort Ram M. Narayanan
collection DOAJ
description Radio frequency (RF) circuit elements that are traditionally considered to be linear frequently exhibit nonlinear properties that affect the intended operation of many other RF systems. Devices such as RF connectors, antennas, attenuators, resistors, and dissimilar metal junctions generate nonlinear distortion that degrades primary RF system performance. The communications industry is greatly affected by these unintended and unexpected nonlinear distortions. The high transmit power and tight channel spacing of the communication channel makes communications very susceptible to nonlinear distortion. To minimize nonlinear distortion in RF systems, specialized circuits are required to measure the low level nonlinear distortions created from traditionally linear devices, i.e., connectors, cables, antennas, etc. Measuring the low-level nonlinear distortion is a difficult problem. The measurement system requires the use of high power probe signals and the capability to measure very weak nonlinear distortions. Measuring the weak nonlinear distortion becomes increasingly difficult in the presence of higher power probe signals, as the high power probe signal generates distortion products in the measurement system. This paper describes a circuit design architecture that achieves 175 dB of dynamic range which can be used to measure low level harmonic distortion from various passive RF circuit elements.
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spelling doaj.art-d503ae43ffb749a1abf58c361196c5812022-12-21T19:26:58ZengMDPI AGInstruments2410-390X2018-08-01231610.3390/instruments2030016instruments2030016Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement SystemRam M. Narayanan0Kyle A. Gallagher1Gregory J. Mazzaro2Anthony F. Martone3Kelly D. Sherbondy4School of Electrical Engineering and Computer Science, The Pennsylvania State University, University Park, PA 16802, USAU.S. Army Research Laboratory, Sensors Directorate, Adelphi, MD 20783, USAThe Citadel, Department of Electrical & Computer Engineering, Charleston, SC 29409, USAU.S. Army Research Laboratory, Sensors Directorate, Adelphi, MD 20783, USAU.S. Army Research Laboratory, Sensors Directorate, Adelphi, MD 20783, USARadio frequency (RF) circuit elements that are traditionally considered to be linear frequently exhibit nonlinear properties that affect the intended operation of many other RF systems. Devices such as RF connectors, antennas, attenuators, resistors, and dissimilar metal junctions generate nonlinear distortion that degrades primary RF system performance. The communications industry is greatly affected by these unintended and unexpected nonlinear distortions. The high transmit power and tight channel spacing of the communication channel makes communications very susceptible to nonlinear distortion. To minimize nonlinear distortion in RF systems, specialized circuits are required to measure the low level nonlinear distortions created from traditionally linear devices, i.e., connectors, cables, antennas, etc. Measuring the low-level nonlinear distortion is a difficult problem. The measurement system requires the use of high power probe signals and the capability to measure very weak nonlinear distortions. Measuring the weak nonlinear distortion becomes increasingly difficult in the presence of higher power probe signals, as the high power probe signal generates distortion products in the measurement system. This paper describes a circuit design architecture that achieves 175 dB of dynamic range which can be used to measure low level harmonic distortion from various passive RF circuit elements.http://www.mdpi.com/2410-390X/2/3/16high dynamic range measurementsharmonic measurement systemnonlinear distortionharmonic radarpassive RF components
spellingShingle Ram M. Narayanan
Kyle A. Gallagher
Gregory J. Mazzaro
Anthony F. Martone
Kelly D. Sherbondy
Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System
Instruments
high dynamic range measurements
harmonic measurement system
nonlinear distortion
harmonic radar
passive RF components
title Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System
title_full Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System
title_fullStr Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System
title_full_unstemmed Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System
title_short Hardware Design of a High Dynamic Range Radio Frequency (RF) Harmonic Measurement System
title_sort hardware design of a high dynamic range radio frequency rf harmonic measurement system
topic high dynamic range measurements
harmonic measurement system
nonlinear distortion
harmonic radar
passive RF components
url http://www.mdpi.com/2410-390X/2/3/16
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