Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals
Lithography-free black metals composed of a nano-layered stack of materials are attractive not only due to their optical properties but also by virtue of fabrication simplicity and the cost reduction of devices based on such structures. We demonstrate multi-layer black metal layered structures with...
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MDPI AG
2020-08-01
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author | Takuhiro Kumagai Naoki To Armandas Balčytis Gediminas Seniutinas Saulius Juodkazis Yoshiaki Nishijima |
author_facet | Takuhiro Kumagai Naoki To Armandas Balčytis Gediminas Seniutinas Saulius Juodkazis Yoshiaki Nishijima |
author_sort | Takuhiro Kumagai |
collection | DOAJ |
description | Lithography-free black metals composed of a nano-layered stack of materials are attractive not only due to their optical properties but also by virtue of fabrication simplicity and the cost reduction of devices based on such structures. We demonstrate multi-layer black metal layered structures with engineered electromagnetic absorption in the mid-infrared (MIR) wavelength range. Characterization of thin <inline-formula><math display="inline"><semantics><mrow><msub><mi>SiO</mi><mn>2</mn></msub></mrow></semantics></math></inline-formula> and Si films sandwiched between two Au layers by way of experimental electromagnetic radiation absorption and thermal radiation emission measurements as well as finite difference time domain (FDTD) numerical simulations is presented. Comparison of experimental and simulation data derived optical properties of multi-layer black metals provide guidelines for absorber/emitter structure design and potential applications. In addition, relatively simple lithography-free multi-layer structures are shown to exhibit absorber/emitter performance that is on par with what is reported in the literature for considerably more elaborate nano/micro-scale patterned metasurfaces. |
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id | doaj.art-d506df51e8b1421bbd58e8aee0efa05f |
institution | Directory Open Access Journal |
issn | 2072-666X |
language | English |
last_indexed | 2024-03-10T16:43:19Z |
publishDate | 2020-08-01 |
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series | Micromachines |
spelling | doaj.art-d506df51e8b1421bbd58e8aee0efa05f2023-11-20T11:53:58ZengMDPI AGMicromachines2072-666X2020-08-0111982410.3390/mi11090824Kirchhoff’s Thermal Radiation from Lithography-Free Black MetalsTakuhiro Kumagai0Naoki To1Armandas Balčytis2Gediminas Seniutinas3Saulius Juodkazis4Yoshiaki Nishijima5Department of Physics, Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, JapanDepartment of Physics, Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, JapanDepartment of Physics, Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, JapanOptical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, VIC 3122, AustraliaOptical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Swinburne University of Technology, Hawthorn, VIC 3122, AustraliaDepartment of Physics, Electrical and Computer Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, JapanLithography-free black metals composed of a nano-layered stack of materials are attractive not only due to their optical properties but also by virtue of fabrication simplicity and the cost reduction of devices based on such structures. We demonstrate multi-layer black metal layered structures with engineered electromagnetic absorption in the mid-infrared (MIR) wavelength range. Characterization of thin <inline-formula><math display="inline"><semantics><mrow><msub><mi>SiO</mi><mn>2</mn></msub></mrow></semantics></math></inline-formula> and Si films sandwiched between two Au layers by way of experimental electromagnetic radiation absorption and thermal radiation emission measurements as well as finite difference time domain (FDTD) numerical simulations is presented. Comparison of experimental and simulation data derived optical properties of multi-layer black metals provide guidelines for absorber/emitter structure design and potential applications. In addition, relatively simple lithography-free multi-layer structures are shown to exhibit absorber/emitter performance that is on par with what is reported in the literature for considerably more elaborate nano/micro-scale patterned metasurfaces.https://www.mdpi.com/2072-666X/11/9/824thermal radiationmetasurfaceblack metal |
spellingShingle | Takuhiro Kumagai Naoki To Armandas Balčytis Gediminas Seniutinas Saulius Juodkazis Yoshiaki Nishijima Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals Micromachines thermal radiation metasurface black metal |
title | Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals |
title_full | Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals |
title_fullStr | Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals |
title_full_unstemmed | Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals |
title_short | Kirchhoff’s Thermal Radiation from Lithography-Free Black Metals |
title_sort | kirchhoff s thermal radiation from lithography free black metals |
topic | thermal radiation metasurface black metal |
url | https://www.mdpi.com/2072-666X/11/9/824 |
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