Limited-Information Signal De-Embedding for a Grain Bin Electromagnetic Imaging System
Measurements taken with a Vector Network Analyzer (VNA) are often corrupted by the presence of 2-port networks such as cables or amplifiers between the VNA and device-under-test (DUT). These 2-port devices are an essential part of the signal path, but distort the desired measurements. These distorti...
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
|
| Series: | IEEE Open Journal of Antennas and Propagation |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9845350/ |