Influence of microwave plasma parameters on light emission from SiV color centers in nanocrystalline diamond films

Influence of microwave plasma parameters on light emission from SiV color centers in nanocrystalline diamond films

Zero phonon line (ZPL) shape, position and integral intensity of SiV defect center in diamond is presented for nanocrystalline diamond (NCD) films grown at different conditions, NCD films of average grain sizes from ~50 nm up to ~180 nm have been deposited onto c-Si wafer at substrate temperature of...

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Bibliographic Details
Main Authors: Himics László, Tóth Sára, Veres Miklós, Csíkvári Péter, Koós Margit
Format: Article
Language:English
Published: De Gruyter 2014-11-01
Series:Open Chemistry
Subjects:
nanocrystalline diamond
mw cvd
siv color center
photoluminescence
raman scattering
Online Access:https://doi.org/10.1515/chem-2015-0034

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