A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR
A nondestructive measurement method based on an Optical frequency domain reflectometry (OFDR) was demonstrated to achieve Young’s modulus of an optical fiber. Such a method can be used to measure, not only the averaged Young’s modulus within the measured fiber length, but also Young’s modulus distri...
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MDPI AG
2022-02-01
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author | Pengfei Li Cailing Fu Huajian Zhong Bin Du Kuikui Guo Yanjie Meng Chao Du Jun He Lei Wang Yiping Wang |
author_facet | Pengfei Li Cailing Fu Huajian Zhong Bin Du Kuikui Guo Yanjie Meng Chao Du Jun He Lei Wang Yiping Wang |
author_sort | Pengfei Li |
collection | DOAJ |
description | A nondestructive measurement method based on an Optical frequency domain reflectometry (OFDR) was demonstrated to achieve Young’s modulus of an optical fiber. Such a method can be used to measure, not only the averaged Young’s modulus within the measured fiber length, but also Young’s modulus distribution along the optical fiber axis. Moreover, the standard deviation of the measured Young’s modulus is calculated to analyze the measurement error. Young’s modulus distribution of the coated and uncoated single mode fiber (SMF) samples was successfully measured along the optical fiber axis. The average Young’s modulus of the coated and uncoated SMF samples was 13.75 ± 0.14, and 71.63 ± 0.43 Gpa, respectively, within the measured fiber length of 500 mm. The measured Young’s modulus distribution along the optical fiber axis could be used to analyze the damage degree of the fiber, which is very useful to nondestructively estimate the service life of optical fiber sensors immersed into smart engineer structures. |
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language | English |
last_indexed | 2024-03-09T21:06:35Z |
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spelling | doaj.art-d76515014db74285bc88c4877d4683ff2023-11-23T21:59:43ZengMDPI AGSensors1424-82202022-02-01224145010.3390/s22041450A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDRPengfei Li0Cailing Fu1Huajian Zhong2Bin Du3Kuikui Guo4Yanjie Meng5Chao Du6Jun He7Lei Wang8Yiping Wang9Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaShenzhen Key Laboratory of Polymer Science and Technology, College of Materials Science and Engineering, Shenzhen University, Shenzhen 518055, ChinaKey Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, ChinaA nondestructive measurement method based on an Optical frequency domain reflectometry (OFDR) was demonstrated to achieve Young’s modulus of an optical fiber. Such a method can be used to measure, not only the averaged Young’s modulus within the measured fiber length, but also Young’s modulus distribution along the optical fiber axis. Moreover, the standard deviation of the measured Young’s modulus is calculated to analyze the measurement error. Young’s modulus distribution of the coated and uncoated single mode fiber (SMF) samples was successfully measured along the optical fiber axis. The average Young’s modulus of the coated and uncoated SMF samples was 13.75 ± 0.14, and 71.63 ± 0.43 Gpa, respectively, within the measured fiber length of 500 mm. The measured Young’s modulus distribution along the optical fiber axis could be used to analyze the damage degree of the fiber, which is very useful to nondestructively estimate the service life of optical fiber sensors immersed into smart engineer structures.https://www.mdpi.com/1424-8220/22/4/1450optical frequency domain reflectometrysingle mode fiberYoung’s modulusnondestructive measurement |
spellingShingle | Pengfei Li Cailing Fu Huajian Zhong Bin Du Kuikui Guo Yanjie Meng Chao Du Jun He Lei Wang Yiping Wang A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR Sensors optical frequency domain reflectometry single mode fiber Young’s modulus nondestructive measurement |
title | A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR |
title_full | A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR |
title_fullStr | A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR |
title_full_unstemmed | A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR |
title_short | A Nondestructive Measurement Method of Optical Fiber Young’s Modulus Based on OFDR |
title_sort | nondestructive measurement method of optical fiber young s modulus based on ofdr |
topic | optical frequency domain reflectometry single mode fiber Young’s modulus nondestructive measurement |
url | https://www.mdpi.com/1424-8220/22/4/1450 |
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