Numerical simulation of the generation of secondary electrons in the High Current Experiment

Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 e...

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Bibliographic Details
Main Authors: P. H. Stoltz, M. A. Furman, J.-L. Vay, A. W. Molvik, R. H. Cohen
Format: Article
Language:English
Published: American Physical Society 2003-05-01
Series:Physical Review Special Topics. Accelerators and Beams
Online Access:http://doi.org/10.1103/PhysRevSTAB.6.054701
Description
Summary:Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 electrons at normal incidence at an ion energy of 60 MeV. Using an empirical angular dependence, the secondary electron yield is combined with a numerical simulation of the HCX ion beam dynamics to obtain an estimate for the number of secondary electrons expected per ion-wall collision in the HCX. This estimate is that approximately 150–200 electrons per ion collision may result in the HCX.
ISSN:1098-4402