Resonance shifting by ferrite thick film superstrate
Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity (ε' and ε&#...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Faculty of Technical Sciences in Cacak
2018-01-01
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| Series: | Serbian Journal of Electrical Engineering |
| Subjects: | |
| Online Access: | http://www.doiserbia.nb.rs/img/doi/1451-4869/2018/1451-48691803275R.pdf |
| Summary: | Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing
technique on alumina substrates. Structural analysis was undertaken using
X-ray diffraction and Scanning electron microscopy techniques. A new
approach for the determination of complex permittivity (ε' and ε'' ) using
microwave property perturbation is unveiled. Ag thick film microstrip ring
resonator (MSRR) with and without the thick film substrate was used for the
microwave transmission studies in the frequency region of 8-12 GHz. The
microwave conductivity of the thick films lies in the range of 1.779 S/cm to
2.296 S/cm. The penetration depth is also reported within the X-band of
microwave frequencies. |
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| ISSN: | 1451-4869 2217-7183 |