Effects of Gate Stack Composition and Thickness in 2-D Negative Capacitance FETs

Negative capacitance (NC) field-effect transistors (FETs) with 2-D semiconducting channels have become increasingly attractive due to their ability to produce sub-60 mV/dec switching behavior in a physically scalable device. However, it has yet to be determined how gate control, including threshold...

Szczegółowa specyfikacja

Opis bibliograficzny
Główni autorzy: Yuh-Chen Lin, Felicia McGuire, Steven Noyce, Nicholas Williams, Zhihui Cheng, Joseph Andrews, Aaron D. Franklin
Format: Artykuł
Język:English
Wydane: IEEE 2019-01-01
Seria:IEEE Journal of the Electron Devices Society
Hasła przedmiotowe:
Dostęp online:https://ieeexplore.ieee.org/document/8735840/