Synchrotron X-ray fluorescence analysis in environmental and earth sciences

Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical...

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Bibliographic Details
Main Author: Adams F.
Format: Article
Language:English
Published: EDP Sciences 2010-12-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/201009013
Description
Summary:Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 10–20 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation) information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed.
ISSN:2100-014X