Synchrotron X-ray fluorescence analysis in environmental and earth sciences
Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical...
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Format: | Article |
Language: | English |
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EDP Sciences
2010-12-01
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Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/201009013 |
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author | Adams F. |
author_facet | Adams F. |
author_sort | Adams F. |
collection | DOAJ |
description | Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 10–20 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation) information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed. |
first_indexed | 2024-12-18T08:26:19Z |
format | Article |
id | doaj.art-d81c32fc54f34673b458e2182b0f6cdc |
institution | Directory Open Access Journal |
issn | 2100-014X |
language | English |
last_indexed | 2024-12-18T08:26:19Z |
publishDate | 2010-12-01 |
publisher | EDP Sciences |
record_format | Article |
series | EPJ Web of Conferences |
spelling | doaj.art-d81c32fc54f34673b458e2182b0f6cdc2022-12-21T21:14:36ZengEDP SciencesEPJ Web of Conferences2100-014X2010-12-01916518010.1051/epjconf/201009013Synchrotron X-ray fluorescence analysis in environmental and earth sciencesAdams F.Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 10–20 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation) information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed.http://dx.doi.org/10.1051/epjconf/201009013 |
spellingShingle | Adams F. Synchrotron X-ray fluorescence analysis in environmental and earth sciences EPJ Web of Conferences |
title | Synchrotron X-ray fluorescence analysis in environmental and earth sciences |
title_full | Synchrotron X-ray fluorescence analysis in environmental and earth sciences |
title_fullStr | Synchrotron X-ray fluorescence analysis in environmental and earth sciences |
title_full_unstemmed | Synchrotron X-ray fluorescence analysis in environmental and earth sciences |
title_short | Synchrotron X-ray fluorescence analysis in environmental and earth sciences |
title_sort | synchrotron x ray fluorescence analysis in environmental and earth sciences |
url | http://dx.doi.org/10.1051/epjconf/201009013 |
work_keys_str_mv | AT adamsf synchrotronxrayfluorescenceanalysisinenvironmentalandearthsciences |