Phases and Interfaces in the Cr–Fe–Si Ternary System: X-ray Diffraction and Electron Microscopy Study

Phases and Interfaces in the Cr–Fe–Si Ternary System: X-ray Diffraction and Electron Microscopy Study

The ternary Cr-Fe-Si system was investigated with X-ray diffraction, energy dispersive X-ray spectrometry, scanning and transmission electron microscopy, and electron diffraction. Samples melted at 1723 K were examined right after cooling or after annealing at 1073 K for 3 days to determine phases,...

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Bibliographic Details
Main Authors: Elena I. Suvorova, Natalya A. Arkharova, Anna G. Ivanova, Fedor Yu. Solomkin, Philippe A. Buffat
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Inorganics
Subjects:
ternary Cr-Fe-Si system
phases
annealing
interphase interface
orientation relationships
Online Access:https://www.mdpi.com/2304-6740/11/2/73

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