Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples
Micro-X-ray fluorescence and X-ray absorption fine structure (µ-XRF-XAFS) is one of the most powerful tools to identify the distribution and speciation of trace elements in natural samples with µm spatial resolution. However, conventional µ-XRF-XAFS studies applied to rare earth elements (REEs: lant...
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MDPI AG
2023-05-01
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author | Makoto Nagasawa Oki Sekizawa Kiyofumi Nitta Teruhiko Kashiwabara Yoshio Takahashi |
author_facet | Makoto Nagasawa Oki Sekizawa Kiyofumi Nitta Teruhiko Kashiwabara Yoshio Takahashi |
author_sort | Makoto Nagasawa |
collection | DOAJ |
description | Micro-X-ray fluorescence and X-ray absorption fine structure (µ-XRF-XAFS) is one of the most powerful tools to identify the distribution and speciation of trace elements in natural samples with µm spatial resolution. However, conventional µ-XRF-XAFS studies applied to rare earth elements (REEs: lanthanide elements + Y in this study) are mainly limited to their L-edges and L lines (except for Y) that are subject to strong interferences from other elements (mainly transition metals). In this study, we extend µ-XRF-XAFS to the higher energy region (HE-µ-XRF-XAFS) by using an incident X-ray microbeam (size: ca. 1 × 1 µm<sup>2</sup>) between 38 and 54 keV to realize K-edge excitation lanthanide analysis without interferences from other elements at the BL37XU beamline, SPring-8 (Japan). This method enables us to simultaneously analyze (i) REE patterns (from La to Dy), (ii) XAFS spectra, and (iii) µm-scale distribution of each REE in the natural sample. The proposed method also realizes the simultaneous application of µ-XAFS at low (e.g., Fe K-edge) and high (lanthanide K-edges) energy at the same spot without changing the setup of the µ-XRF-XAFS system using the detuning technique. |
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spelling | doaj.art-d851a2e332134b139831f8a3fbbec2952023-11-18T11:44:59ZengMDPI AGMinerals2075-163X2023-05-0113674610.3390/min13060746Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural SamplesMakoto Nagasawa0Oki Sekizawa1Kiyofumi Nitta2Teruhiko Kashiwabara3Yoshio Takahashi4Department of Earth and Planetary Science, Graduate School of Science, The University of Tokyo, Tokyo 113-0033, JapanJapan Synchrotron Radiation Research Institute (JASRI), Hyogo 679-5198, JapanJapan Synchrotron Radiation Research Institute (JASRI), Hyogo 679-5198, JapanSubmarine Resources Research Center (SRRC), Japan Agency for Marine-Earth Science and Technology (JAMSTEC), Yokosuka 237-0061, JapanDepartment of Earth and Planetary Science, Graduate School of Science, The University of Tokyo, Tokyo 113-0033, JapanMicro-X-ray fluorescence and X-ray absorption fine structure (µ-XRF-XAFS) is one of the most powerful tools to identify the distribution and speciation of trace elements in natural samples with µm spatial resolution. However, conventional µ-XRF-XAFS studies applied to rare earth elements (REEs: lanthanide elements + Y in this study) are mainly limited to their L-edges and L lines (except for Y) that are subject to strong interferences from other elements (mainly transition metals). In this study, we extend µ-XRF-XAFS to the higher energy region (HE-µ-XRF-XAFS) by using an incident X-ray microbeam (size: ca. 1 × 1 µm<sup>2</sup>) between 38 and 54 keV to realize K-edge excitation lanthanide analysis without interferences from other elements at the BL37XU beamline, SPring-8 (Japan). This method enables us to simultaneously analyze (i) REE patterns (from La to Dy), (ii) XAFS spectra, and (iii) µm-scale distribution of each REE in the natural sample. The proposed method also realizes the simultaneous application of µ-XAFS at low (e.g., Fe K-edge) and high (lanthanide K-edges) energy at the same spot without changing the setup of the µ-XRF-XAFS system using the detuning technique.https://www.mdpi.com/2075-163X/13/6/746high energy µ-XRF-XAFSrare earth elements (REEs)K-edges and K lines of REEsspeciationREE patternweathered granite |
spellingShingle | Makoto Nagasawa Oki Sekizawa Kiyofumi Nitta Teruhiko Kashiwabara Yoshio Takahashi Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples Minerals high energy µ-XRF-XAFS rare earth elements (REEs) K-edges and K lines of REEs speciation REE pattern weathered granite |
title | Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples |
title_full | Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples |
title_fullStr | Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples |
title_full_unstemmed | Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples |
title_short | Development of High-Energy µ-X-ray Fluorescence and X-ray Absorption Fine Structure for the Distribution and Speciation of Rare Earth Elements in Natural Samples |
title_sort | development of high energy µ x ray fluorescence and x ray absorption fine structure for the distribution and speciation of rare earth elements in natural samples |
topic | high energy µ-XRF-XAFS rare earth elements (REEs) K-edges and K lines of REEs speciation REE pattern weathered granite |
url | https://www.mdpi.com/2075-163X/13/6/746 |
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