Kumada, T., Ohtsuka, M., & Fukuyama, H. (2015). Influence of substrate temperature on the crystalline quality of AlN layers deposited by RF reactive magnetron sputtering. AIP Publishing LLC.
Citación estilo ChicagoKumada, Tomoyuki, Makoto Ohtsuka, and Hiroyuki Fukuyama. Influence of Substrate Temperature on the Crystalline Quality of AlN Layers Deposited by RF Reactive Magnetron Sputtering. AIP Publishing LLC, 2015.
Cita MLAKumada, Tomoyuki, et al. Influence of Substrate Temperature on the Crystalline Quality of AlN Layers Deposited by RF Reactive Magnetron Sputtering. AIP Publishing LLC, 2015.
Warning: These citations may not always be 100% accurate.