A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect

A scanning tunneling microscopy based potentiometry technique for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry technique is developed and employed to maintain a desired tunneling voltage independent of the bias curr...

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Bibliographic Details
Main Authors: Ting Xie, Michael Dreyer, David Bowen, Dan Hinkel, R. E. Butera, Charles Krafft, Isaak Mayergoyz
Format: Article
Language:English
Published: AIP Publishing LLC 2017-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4991916
Description
Summary:A scanning tunneling microscopy based potentiometry technique for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry technique is developed and employed to maintain a desired tunneling voltage independent of the bias current flow through the film. The application of this potentiometry technique to the local sensing of the spin Hall effect is outlined and some experimental results are reported.
ISSN:2158-3226