Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe
To avoid depth-of-field mismatches caused by the changes in pipe structure and image overexposures caused by highly reflective surfaces while radial imaging irregular pipes, this paper proposes a novel all-in-focus, adaptable, and low scene-coupling method that suppresses overexposures in support of...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-10-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/22/19/7634 |
| _version_ | 1797476850234032128 |
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| author | Shuangjie Wang Qiang Xing Haili Xu Guyue Lu Jiajia Wang |
| author_facet | Shuangjie Wang Qiang Xing Haili Xu Guyue Lu Jiajia Wang |
| author_sort | Shuangjie Wang |
| collection | DOAJ |
| description | To avoid depth-of-field mismatches caused by the changes in pipe structure and image overexposures caused by highly reflective surfaces while radial imaging irregular pipes, this paper proposes a novel all-in-focus, adaptable, and low scene-coupling method that suppresses overexposures in support of fault detection. Firstly, the pipeline’s radial depth distribution data are obtained by sensors, and an optimal all-in-focus imaging scheme is established by combining camera parameters. Secondly, using digital imaging technology, the high reflection effect produced by disparate light sources is comprehensively evaluated for overexposure suppression. Thirdly, a device is designed for imaging non-Lambertian free-form surface scenes under low illumination, providing the sequence images needed for the next step. Lastly, specific digital fusions are made to the sequential images to obtain an all-in-focus final image without overexposure. An image-quality analysis method is then used to measure the efficacy of the system in obtaining the characteristic information of the inner surfaces of an irregular pipe. Results of the experiment show that the method and device used are able to distinguish small 0.5 mm wide lines ranging from 40–878 mm depth and are capable of providing efficient image support for defect inspection of irregular pipes and free-form surfaces amongst other irregular surfaces. |
| first_indexed | 2024-03-09T21:09:36Z |
| format | Article |
| id | doaj.art-db1b046537bd477dae01581b2f664415 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-09T21:09:36Z |
| publishDate | 2022-10-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-db1b046537bd477dae01581b2f6644152023-11-23T21:52:23ZengMDPI AGSensors1424-82202022-10-012219763410.3390/s22197634Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular PipeShuangjie Wang0Qiang Xing1Haili Xu2Guyue Lu3Jiajia Wang4School of Mechanical Engineering, Nantong University, Nantong 226019, ChinaSchool of Mechanical Engineering, Nantong University, Nantong 226019, ChinaSchool of Mechanical Engineering, Nantong University, Nantong 226019, ChinaSchool of Mechanical Engineering, Nantong University, Nantong 226019, ChinaSchool of Mechanical Engineering, Nantong University, Nantong 226019, ChinaTo avoid depth-of-field mismatches caused by the changes in pipe structure and image overexposures caused by highly reflective surfaces while radial imaging irregular pipes, this paper proposes a novel all-in-focus, adaptable, and low scene-coupling method that suppresses overexposures in support of fault detection. Firstly, the pipeline’s radial depth distribution data are obtained by sensors, and an optimal all-in-focus imaging scheme is established by combining camera parameters. Secondly, using digital imaging technology, the high reflection effect produced by disparate light sources is comprehensively evaluated for overexposure suppression. Thirdly, a device is designed for imaging non-Lambertian free-form surface scenes under low illumination, providing the sequence images needed for the next step. Lastly, specific digital fusions are made to the sequential images to obtain an all-in-focus final image without overexposure. An image-quality analysis method is then used to measure the efficacy of the system in obtaining the characteristic information of the inner surfaces of an irregular pipe. Results of the experiment show that the method and device used are able to distinguish small 0.5 mm wide lines ranging from 40–878 mm depth and are capable of providing efficient image support for defect inspection of irregular pipes and free-form surfaces amongst other irregular surfaces.https://www.mdpi.com/1424-8220/22/19/7634all-in-focushigh reflectionirregular pipefree-form surfacenon-Lambertian surfaceoverexposure |
| spellingShingle | Shuangjie Wang Qiang Xing Haili Xu Guyue Lu Jiajia Wang Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe Sensors all-in-focus high reflection irregular pipe free-form surface non-Lambertian surface overexposure |
| title | Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe |
| title_full | Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe |
| title_fullStr | Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe |
| title_full_unstemmed | Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe |
| title_short | Method and Device of All-in-Focus Imaging with Overexposure Suppression in an Irregular Pipe |
| title_sort | method and device of all in focus imaging with overexposure suppression in an irregular pipe |
| topic | all-in-focus high reflection irregular pipe free-form surface non-Lambertian surface overexposure |
| url | https://www.mdpi.com/1424-8220/22/19/7634 |
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