Rapid evaluation of particle properties using inverse SEM simulations

The characteristic X-rays produced by the interactions of the electron beam with the sample in a scanning electron microscope (SEM) are usually captured with a variable-energy detector, a process termed energy dispersive spectrometry (EDS). The purpose of this work is to exploit inverse simulations...

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Main Authors: Bekar Kursat B., Miller Thomas M., Patton Bruce W., Weber Charles F.
Format: Article
Language:English
Published: EDP Sciences 2017-01-01
Series:EPJ Web of Conferences
Online Access:https://doi.org/10.1051/epjconf/201715306013
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author Bekar Kursat B.
Miller Thomas M.
Patton Bruce W.
Weber Charles F.
author_facet Bekar Kursat B.
Miller Thomas M.
Patton Bruce W.
Weber Charles F.
author_sort Bekar Kursat B.
collection DOAJ
description The characteristic X-rays produced by the interactions of the electron beam with the sample in a scanning electron microscope (SEM) are usually captured with a variable-energy detector, a process termed energy dispersive spectrometry (EDS). The purpose of this work is to exploit inverse simulations of SEM-EDS spectra to enable rapid determination of sample properties, particularly elemental composition. This is accomplished using penORNL, a modified version of PENELOPE, and a modified version of the traditional Levenberg–Marquardt nonlinear optimization algorithm, which together is referred to as MOZAIK-SEM. The overall conclusion of this work is that MOZAIK-SEM is a promising method for performing inverse analysis of X-ray spectra generated within a SEM. As this methodology exists now, MOZAIK-SEM has been shown to calculate the elemental composition of an unknown sample within a few percent of the actual composition.
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spelling doaj.art-dbb2c3948d1e441f952d41c7e7de309b2022-12-21T19:56:58ZengEDP SciencesEPJ Web of Conferences2100-014X2017-01-011530601310.1051/epjconf/201715306013epjconf_icrs2017_06013Rapid evaluation of particle properties using inverse SEM simulationsBekar Kursat B.0Miller Thomas M.1Patton Bruce W.2Weber Charles F.3Oak Ridge National Laboratory, Reactor and Nuclear Systems DivisionOak Ridge National Laboratory, Reactor and Nuclear Systems DivisionOak Ridge National Laboratory, Reactor and Nuclear Systems DivisionOak Ridge National Laboratory, Reactor and Nuclear Systems DivisionThe characteristic X-rays produced by the interactions of the electron beam with the sample in a scanning electron microscope (SEM) are usually captured with a variable-energy detector, a process termed energy dispersive spectrometry (EDS). The purpose of this work is to exploit inverse simulations of SEM-EDS spectra to enable rapid determination of sample properties, particularly elemental composition. This is accomplished using penORNL, a modified version of PENELOPE, and a modified version of the traditional Levenberg–Marquardt nonlinear optimization algorithm, which together is referred to as MOZAIK-SEM. The overall conclusion of this work is that MOZAIK-SEM is a promising method for performing inverse analysis of X-ray spectra generated within a SEM. As this methodology exists now, MOZAIK-SEM has been shown to calculate the elemental composition of an unknown sample within a few percent of the actual composition.https://doi.org/10.1051/epjconf/201715306013
spellingShingle Bekar Kursat B.
Miller Thomas M.
Patton Bruce W.
Weber Charles F.
Rapid evaluation of particle properties using inverse SEM simulations
EPJ Web of Conferences
title Rapid evaluation of particle properties using inverse SEM simulations
title_full Rapid evaluation of particle properties using inverse SEM simulations
title_fullStr Rapid evaluation of particle properties using inverse SEM simulations
title_full_unstemmed Rapid evaluation of particle properties using inverse SEM simulations
title_short Rapid evaluation of particle properties using inverse SEM simulations
title_sort rapid evaluation of particle properties using inverse sem simulations
url https://doi.org/10.1051/epjconf/201715306013
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